Patents by Inventor Thomas W. Sidle

Thomas W. Sidle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8181132
    Abstract: In one embodiment, a method includes simulating by one or more computer systems a larger circuit to assign one or more values to one or more latch variables associated with the larger circuit, generating by the one or more computer systems one or more reduced circuits from the larger circuit according to the values assigned to the latch variables, generating by the one or more computer systems a transition relation (TR) for each reduced circuit, and generating by the one or more computer systems an initial state set for one or more instances of validation on the reduced circuits according to the TRs.
    Type: Grant
    Filed: April 30, 2009
    Date of Patent: May 15, 2012
    Assignee: Fujitsu Limited
    Inventors: Jawahar Jain, Subramanian K. Iyer, Mukul R. Prasad, Thomas W. Sidle
  • Publication number: 20090210212
    Abstract: In one embodiment, a method includes simulating by one or more computer systems a larger circuit to assign one or more values to one or more latch variables associated with the larger circuit, generating by the one or more computer systems one or more reduced circuits from the larger circuit according to the values assigned to the latch variables, generating by the one or more computer systems a transition relation (TR) for each reduced circuit, and generating by the one or more computer systems an initial state set for one or more instances of validation on the reduced circuits according to the TRs.
    Type: Application
    Filed: April 30, 2009
    Publication date: August 20, 2009
    Applicant: Fujitsu Limited
    Inventors: Jawahar Jain, Subramanian K. Iyer, Mukul R. Prasad, Thomas W. Sidle
  • Patent number: 7546563
    Abstract: In one embodiment, a method for validating one or more circuits using one or more grids includes accessing a circuit and generating one or more seeds for executing one or more instances of validation on the circuit. Each instance of validation comprising one or more tasks. The method also includes distributing the tasks and the seeds across a grid including multiple nodes and, using the seeds, executing the instances of validation at the nodes in the grid according to the tasks.
    Type: Grant
    Filed: June 28, 2005
    Date of Patent: June 9, 2009
    Assignee: Fujitsu Limited
    Inventors: Jawahar Jain, Subramanian K. Iyer, Mukul R. Prasad, Thomas W. Sidle
  • Patent number: 7360186
    Abstract: In one embodiment, a method for invariant checking includes executing one or more first steps of a finite state machine (FSM) corresponding to one or more binary decision diagrams (BDDs) to traverse a state space of the FSM in a first direction with respect to an initial state and an erroneous state.
    Type: Grant
    Filed: April 28, 2005
    Date of Patent: April 15, 2008
    Assignee: Fujitsu Limited
    Inventors: Thomas W. Sidle, Christian Stangier, Koichiro Takayama
  • Publication number: 20080072190
    Abstract: In one embodiment, a method for validating one or more circuits using one or more grids includes accessing a circuit and generating one or more seeds for executing one or more instances of validation on the circuit. Each instance of validation comprising one or more tasks. The method also includes distributing the tasks and the seeds across a grid including multiple nodes and, using the seeds, executing the instances of validation at the nodes in the grid according to the tasks.
    Type: Application
    Filed: June 28, 2005
    Publication date: March 20, 2008
    Inventors: Jawahar Jain, Subramanian K. Iyer, Mukul R. Prasad, Thomas W. Sidle