Patents by Inventor Thomas Wik

Thomas Wik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060218455
    Abstract: Systems and methods are disclosed for testing a synchronous memory system by electrically stressing one or more electrical conditions of the component circuits; providing a Built-In Self-Test (BIST) controller to control the electrical stress during device testing; and providing a test stimuli during testing. In another aspect, the memory system testing includes setting a self-timed control input of the memory system to a predetermined self timed period value; and testing the memory based on the predetermined self timed period value.
    Type: Application
    Filed: March 23, 2005
    Publication date: September 28, 2006
    Inventors: Kevin LeClair, Thomas Wik, Chuong Le, Hieu Nguyen, Duytan Tran, Kevin Bligh