Abstract: The invention relates to a device and a method for analyzing a substance (5), comprising an excitation transmitting device in the form of a laser device (3) for generating at least one electromagnetic excitation beam (8), a measuring body (1) having a detection region (4), which is adjacent to a measuring surface (2) of the measuring body (1) and has a pressure-dependent or temperature-dependent specific electrical resistance and/or generates electrical, in particular piezoelectric, voltage signals in the event of pressure or temperature changes, and comprising a device for analyzing the substance on the basis of detected signals.

Abstract: An apparatus (10) for analyzing a material (12) comprising at least one analyte, said apparatus comprising a measurement body (16) having a contact surface (14) suitable to be brought in thermal contact or pressure-transmitting contact with said material (12), an excitation radiation source (26) configured for irradiating excitation radiation (18) into the material (12) to be absorbed therein, and a detection device for detecting a physical response of the measurement body to heat or a pressure wave received from said material (12) upon absorption of said excitation radiation (18) and for generating a response signal indicative of the degree of absorption of excitation radiation, wherein a protrusion (80) is provided, said protrusion having a front surface (82) facing said material (12) and being in contact with the material when the material is brought in contact with the contact surface, and wherein said excitation radiation (18) is irradiated into the material (12) through said front surface (82) of said p

Abstract: A method of analyzing a material (12) comprising at least one analyte, said method comprising a material status analyzing procedure (76), in which a present status of the material is analyzed, wherein based on a result of said material status analyzing procedure (76), at least one of a selection of analyte-characteristic-wavelengths used during an analyte measurement procedure (78), an absolute time or a relative time proportion of use of analyte-characteristic-wavelengths during said analyte measurement procedure (78), an individual excitation radiation intensity, or a relative weight given to the wavelengths in the analysis, a selection of analyte-characteristic-wavelengths to be used simultaneously during said analyte measurement procedure (78), and a selection of one or more main frequencies of the modulation of said excitation radiation (18) intensity to be used during said analyte measurement procedure (78) is determined.

Abstract: A method of analyzing a material (12) comprising at least one analyte, wherein analyte-wavelength-specific measurements are interspersed with reference measurements (80), and wherein response signals obtained for the reference measurements (80) are used for one or more of calibrating an excitation radiation source (26) for generating said excitation radiation, calibrating said detection device, recognizing a variation in the measurement conditions by comparing results of individual reference measurements (80), adapting the analyte measurement procedure (78) with respect to one or more of the entire duration thereof, the absolute or relative duration of analyte-wavelength-specific measurements for a given analyte-characteristic-wavelength, or terminating and/or restarting the analyte measurement procedure, and adapting the analysis carried out in the analyzing step.

Abstract: Disclosed herein is an apparatus (10) for analyzing a material (12) comprising at least one analyte, said apparatus (10) comprising a measurement body (16) having a contact surface (14) suitable to be brought in thermal contact or pressure-transmitting contact with said material (12), an excitation radiation source configured for irradiating excitation radiation into the material (12) to be absorbed therein, and a detection light source for generating a detection light beam (22) travelling through at least a portion of said measurement body (16) or a component included in said measurement body, wherein said detection light beam is directed to be totally or partially reflected at said contact surface (14), wherein said contact surface (14) of the measurement body is curved in at least one principal direction in the area where the detection light beam (22) is reflected.

Abstract: An apparatus for analyzing a material includes an excitation emission device for generating at least one electromagnetic excitation beam, in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device for detecting a reaction signal, and a device for analyzing the material on the basis of the detected reaction signal.

Abstract: The invention relates, inter alia, to a device (10) for analysing a material (101), comprising an excitation emission device (100) for generating at least one electromagnetic excitation beam (SA), particularly an excitation light beam, with at least one excitation wavelength, and further comprising a detection device (106) for detecting a reaction signal (SR), and a device (107) for analysing the material on the basis of the detected reaction signal (SR).

Abstract: The invention relates to a device for analyzing a substance, comprising: —a measurement body (1, 1a), which has a measurement surface (2) and is to be brought at least in part into contact with the substance (3) in the region of the measurement surface for the purpose of measuring; a laser device (4), particularly having a quantum cascade laser (QCL), a tunable QCL and/or a laser array, preferably an array of QCLs, in order to generate one or more excitation beams (10) at different wavelengths, preferably in the infrared or medium infrared spectral range, which is directed to the substance (3); and a detection apparatus (5, 6, 7) which is integrated at least in part in the measurement body (1, 1a) or connected thereto and comprises the following: •a source (5) for coherent detection light (11) and •a first optical waveguide structure (6) which can be or is connected to the source for the detection light, which guides the detection light, and has a refractive index which is dependent at least in portions on th

Abstract: The invention relates to a device and a method for analyzing a substance (5), comprising an excitation transmitting device in the form of a laser device (3) for generating at least one electromagnetic excitation beam (8), a measuring body (1) having a detection region (4), which is adjacent to a measuring surface (2) of the measuring body (1) and has a pressure-dependent or temperature-dependent specific electrical resistance and/or generates electrical, in particular piezoelectric, voltage signals in the event of pressure or temperature changes, and comprising a device for analyzing the substance on the basis of detected signals.

Abstract: The invention relates, inter alia, to an apparatus for analyzing a material, including an excitation emission device for generating at least one electromagnetic excitation beam, in particular an exciting light beam, having at least one excitation wavelength, further including a detection device for detecting a reaction signal, and a device for analyzing the material on the basis of the detected reaction signal.

Abstract: The invention relates, inter alia, to an apparatus (10) for analyzing a material (101), comprising an excitation emission device (100) for generating at least one electromagnetic excitation beam (SA), in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device (106) for detecting a reaction signal (SR), and a device (107) for analyzing the material on the basis of the detected reaction signal (SR).

Abstract: The invention relates, inter alia, to an apparatus (10) for analyzing a material (101), comprising an excitation emission device (100) for generating at least one electromagnetic excitation beam (SA), in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device (106) for detecting a reaction signal (SR), and a device (107) for analyzing the material on the basis of the detected reaction signal (SR).

Abstract: The invention relates to an apparatus for analyzing a material comprising an excitation emission device for generating at least one electromagnetic excitation beam, in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device for detecting a reaction signal, and a device for analyzing the material on the basis of the detected reaction signal.

Abstract: The invention relates to an apparatus for analyzing a material comprising an excitation emission device for generating at least one electromagnetic excitation beam, in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device for detecting a reaction signal, and a device for analyzing the material on the basis of the detected reaction signal.

Abstract: The invention relates, inter alia, to a device (10) for analysing a material (101), comprising an excitation emission device (100) for generating at least one electromagnetic excitation beam (SA), particularly an excitation light beam, with at least one excitation wavelength, and further comprising a detection device (106) for detecting a reaction signal (SR), and a device (107) for analysing the material on the basis of the detected reaction signal (SR).