Abstract: An IR sensor comprises a substrate, a rear reflector on the substrate, a supporting layer a PCM layer carried by the supporting layer, and first and second electrically conductive contacts carried by the substrate and coupled to opposing sides of the PCM layer. The IR sensor also includes a circuit coupled to the first and second electrically conductive contacts and configured to apply an electrical bias signal to the PCM layer to generate an electrical oscillation, and detect the frequency modulation (FM) of the oscillation signal based upon IR radiation received by the PCM layer.

Abstract: The present disclosure relates to formulations having one, two, or more chiral dopants, as well as materials and methods including such formulations. In particular instances, the formulation can include an achiral host, such as a nematic substance.

Abstract: An apparatus for measuring normal and shear stress at a surface. The apparatus includes a substrate; and a plurality of sensing units on the substrate. Each sensing unit includes a mechanical transducer having a receiving surface and a sensing surface; and a plurality of normal force sensors between the sensing surface and the substrate.

Abstract: An apparatus for measuring normal and shear stress at a surface. The apparatus includes a substrate; and a plurality of sensing units on the substrate. Each sensing unit includes a mechanical transducer having a receiving surface and a sensing surface; and a plurality of normal force sensors between the sensing surface and the substrate.