Patents by Inventor Tilman Schäffer

Tilman Schäffer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160183800
    Abstract: A device for measuring the elasticity of a macroscopic sample, in particular for measuring the elasticity of tissue of a living human or animal, is disclosed, which comprises the following: at least one outlet for a jet of fluid and/or one inlet for aspiration of a stream of fluid, means for positioning the device in relation to the macroscopic sample in such a way that the outlet and/or the inlet and/or an end face of the device is at a predetermined distance from the macroscopic sample, or at a distance therefrom that can be determined by said means, and a mechanism for measuring a variable that is characteristic of the extent of a deformation of the sample on account of an interaction of the sample with the jet of fluid and/or the aspirated stream of fluid, wherein this variable is determined by an ion current in the deformation area of the sample, or the volumetric flow of the fluid itself, or, if the fluid is enclosed by the elastic sample, by a change of volume and associated change of pressure in the e
    Type: Application
    Filed: August 7, 2014
    Publication date: June 30, 2016
    Applicant: Eberhard Karls Universitat Tubingen
    Inventors: Tilman Schäffer, Andreas Kirschniak
  • Patent number: 8332960
    Abstract: A device for scanning the surface of a sample which is covered with a liquid, comprising a probe which has a tip at one end, means for moving the probe and the sample relative to one another a light source focussing device which focuses light from the light source onto a location in the area of the tip located in the liquid and a detector for detecting light which was scattered by the tip, wherein a boundary surface at which the light enters the liquid is located on the light path between the light source and the tip, wherein the boundary surface is positionally fixed with respect to the probe.
    Type: Grant
    Filed: September 14, 2007
    Date of Patent: December 11, 2012
    Assignee: Westfalische Wilhems-Universitat Munster
    Inventors: Tilman Schäffer, Matthias Böcker, Boris Anczykowski
  • Publication number: 20110162117
    Abstract: A device for scanning the surface of a sample which is covered with a liquid, comprising a probe which has a tip at one end, means for moving the probe and the sample relative to one another a light source focussing device which focuses light from the light source onto a location in the area of the tip located in the liquid and a detector for detecting light which was scattered by the tip, wherein a boundary surface at which the light enters the liquid is located on the light path between the light source and the tip, wherein the boundary surface is positionally fixed with respect to the probe.
    Type: Application
    Filed: September 14, 2007
    Publication date: June 30, 2011
    Inventors: Tilman Schäffer, Matthias Böcker, Boris Anczykowski
  • Publication number: 20090205960
    Abstract: A device and a method for detecting and/or characterizing particles are shown. The device includes at least one nanopore, a voltage source for generating an electric potential difference between the two sides of the at least one nanopore in order to generate an ion current through the nanopore when the nanopore is surrounded by an electrolyte, and a measuring instrument adapted for recording a change in the impedance of the at least one nanopore in respect of the ion current when one or more particles that are to be detected and are present in the electrolyte pass(es) through the at least one nanopore. The device also includes a pipette with an end portion in which an opening is formed. A flow of the particles that are to be detected from outside the pipette is generated through the opening and through the nanopore, and the pipette is moved relative to a sample.
    Type: Application
    Filed: July 6, 2007
    Publication date: August 20, 2009
    Applicant: Westfalische Wilhelms-Universitat Munster
    Inventors: Tilman Schäffer, Harald Fuchs
  • Patent number: 6649902
    Abstract: A high sensitivity beam deflection sensing optical device, such as an atomic force microscope, including one or more of the following: specified means in the path of the incident beam for adjusting the size and/or power of the incident beam spot, means for moving the incident beam spot with movement of the object whereby to maintain the position of the spot on the object, and means for increasing the signal to noise ratio of the optical detector in which adjusted gains are applied to different segments of the optical detector.
    Type: Grant
    Filed: June 7, 2002
    Date of Patent: November 18, 2003
    Assignee: The Regents of the University of California
    Inventors: Tilman Schäffer, Paul K. Hansma
  • Patent number: 6455838
    Abstract: A high sensitivity beam deflection sensing optical device, such as an atomic force microscope, including one or more of the following: specified means in the path of the incident beam for adjusting the size and/or power of the incident beam spot, means for moving the incident beam spot with movement of the object whereby to maintain the position of the spot on the object, and means for increasing the signal to noise ratio of the optical detector in which adjusted gains are applied to different segments of the optical detector.
    Type: Grant
    Filed: October 6, 1998
    Date of Patent: September 24, 2002
    Assignee: The Regents of the University of California
    Inventors: Tilman Schäffer, Paul K. Hansma