Patents by Inventor Tilmann Bruckhaus
Tilmann Bruckhaus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12020415Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.Type: GrantFiled: June 30, 2022Date of Patent: June 25, 2024Assignee: Instrumental, Inc.Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
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Publication number: 20240087104Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.Type: ApplicationFiled: August 3, 2023Publication date: March 14, 2024Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
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Patent number: 11763443Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.Type: GrantFiled: August 30, 2021Date of Patent: September 19, 2023Assignee: Instrumental, Inc.Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
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Publication number: 20220335589Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.Type: ApplicationFiled: June 30, 2022Publication date: October 20, 2022Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
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Publication number: 20210390678Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.Type: ApplicationFiled: August 30, 2021Publication date: December 16, 2021Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
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Patent number: 11132787Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.Type: GrantFiled: July 9, 2019Date of Patent: September 28, 2021Assignee: Instrumental, Inc.Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
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Publication number: 20210084478Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. The dimensionality of a raw signal is reduced into a normalized signal that includes a probability value. The probability value at least approximates a probability that the normalized signal indicates that a real-world event of a specified event type is occurring. Based on the at least approximated probability, the real-world event of the specified event type is detected as a possible planned event occurring at a venue. The possible planned event is validated as an actual planned event. Validation can include validating data associated with the possible planned event with data from an event planning system associated with the venue. An entity is electronically notified that the actual planned event is occurring.Type: ApplicationFiled: November 23, 2020Publication date: March 18, 2021Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
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Patent number: 10848951Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. The dimensionality of a raw signal is reduced into a normalized signal that includes a probability value. The probability value at least approximates a probability that the normalized signal indicates that a real-world event of a specified event type is occurring. Based on the at least approximated probability, the real-world event of the specified event type is detected as a possible planned event occurring at a venue. The possible planned event is validated as an actual planned event. Validation can include validating data associated with the possible planned event with data from an event planning system associated with the venue. An entity is electronically notified that the actual planned event is occurring.Type: GrantFiled: January 13, 2020Date of Patent: November 24, 2020Assignee: safeXai, Inc.Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
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Publication number: 20200154258Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. The dimensionality of a raw signal is reduced into a normalized signal that includes a probability value. The probability value at least approximates a probability that the normalized signal indicates that a real-world event of a specified event type is occurring. Based on the at least approximated probability, the real-world event of the specified event type is detected as a possible planned event occurring at a venue. The possible planned event is validated as an actual planned event. Validation can include validating data associated with the possible planned event with data from an event planning system associated with the venue. An entity is electronically notified that the actual planned event is occurring.Type: ApplicationFiled: January 13, 2020Publication date: May 14, 2020Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
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Publication number: 20200077247Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. A plurality of normalized signals is accessed. Planned event data across the plurality of normalized signals is checked for inconsistencies. Any inconsistencies are resolved in an automated fashion, for example, through reference to databases containing additional information. A planned event can be detected/validated from concurring and/or resolved planned event data. A validator can refer to an event history database and/or a planning system to validate a possible planned event as an actual planned event.Type: ApplicationFiled: June 27, 2019Publication date: March 5, 2020Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
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Patent number: 10575162Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. A plurality of normalized signals is accessed. Planned event data across the plurality of normalized signals is checked for inconsistencies. Any inconsistencies are resolved in an automated fashion, for example, through reference to databases containing additional information. A planned event can be detected/validated from concurring and/or resolved planned event data. A validator can refer to an event history database and/or a planning system to validate a possible planned event as an actual planned event.Type: GrantFiled: June 27, 2019Date of Patent: February 25, 2020Assignee: Banjo, Inc.Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
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Publication number: 20200013156Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.Type: ApplicationFiled: July 9, 2019Publication date: January 9, 2020Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
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Patent number: 10474733Abstract: The present invention extends to methods, systems, and computer program products for detecting events from features derived from multiple signals. In one aspect, an event detection infrastructure determines that characteristics of multiple signals, when considered collectively, indicate an event of interest to one or more parties. In another aspect, an evaluation module determines that characteristics of one or more signals indicate a possible event of interest to one or more parties. A validator then determines that characteristics of one or more other signals validate the possible event as an actual event of interest to the one or more parties. Signal features can be used to compute probabilities of events occurring.Type: GrantFiled: April 9, 2019Date of Patent: November 12, 2019Assignee: Banjo, Inc.Inventors: Damien Patton, Rish Mehta, Tilmann Bruckhaus
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Publication number: 20190251139Abstract: The present invention extends to methods, systems, and computer program products for detecting events from features derived from multiple signals. In one aspect, an event detection infrastructure determines that characteristics of multiple signals, when considered collectively, indicate an event of interest to one or more parties. In another aspect, an evaluation module determines that characteristics of one or more signals indicate a possible event of interest to one or more parties. A validator then determines that characteristics of one or more other signals validate the possible event as an actual event of interest to the one or more parties. Signal features can be used to compute probabilities of events occurring.Type: ApplicationFiled: April 9, 2019Publication date: August 15, 2019Inventors: Damien Patton, Rish Mehta, Tilmann Bruckhaus
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Publication number: 20190251138Abstract: The present invention extends to methods, systems, and computer program products for detecting events from features derived from multiple signals. In one aspect, an event detection infrastructure determines that characteristics of multiple signals, when considered collectively, indicate an event of interest to one or more parties. In another aspect, an evaluation module determines that characteristics of one or more signals indicate a possible event of interest to one or more parties. A validator then determines that characteristics of one or more other signals validate the possible event as an actual event of interest to the one or more parties. Signal features can be used to compute probabilities of events occurring.Type: ApplicationFiled: July 6, 2018Publication date: August 15, 2019Inventors: Damien Patton, Rish Mehta, Tilmann Bruckhaus
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Publication number: 20190253860Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. A plurality of normalized signals is accessed. Planned event data across the plurality of normalized signals is checked for inconsistencies. Any inconsistencies are resolved in an automated fashion, for example, through reference to databases containing additional information. A planned event can be detected/validated from concurring and/or resolved planned event data. A validator can refer to an event history database and/or a planning system to validate a possible planned event as an actual planned event.Type: ApplicationFiled: January 3, 2019Publication date: August 15, 2019Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
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Patent number: 10382938Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. A plurality of normalized signals is accessed. Planned event data across the plurality of normalized signals is checked for inconsistencies. Any inconsistencies are resolved in an automated fashion, for example, through reference to databases containing additional information. A planned event can be detected/validated from concurring and/or resolved planned event data. A validator can refer to an event history database and/or a planning system to validate a possible planned event as an actual planned event.Type: GrantFiled: January 3, 2019Date of Patent: August 13, 2019Assignee: Banjo, Inc.Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
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Patent number: 10353685Abstract: The method for model management includes, within a testing platform: building candidate model(s), validating the candidate model(s), and selectively deploying the candidate model(s) into a production environment. The method can optionally include, within a production environment: detecting a class instance based on the raw data using deployed model(s) within the production environment, and transmitting a notification to an endpoint associated with the detected class.Type: GrantFiled: January 3, 2019Date of Patent: July 16, 2019Assignee: Banjo, Inc.Inventors: Damien Patton, Tilmann Bruckhaus
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Publication number: 20190171428Abstract: The method for model management includes, within a testing platform: building candidate model(s), validating the candidate model(s), and selectively deploying the candidate model(s) into a production environment. The method can optionally include, within a production environment: detecting a class instance based on the raw data using deployed model(s) within the production environment, and transmitting a notification to an endpoint associated with the detected class.Type: ApplicationFiled: January 3, 2019Publication date: June 6, 2019Inventors: Damien Patton, Tilmann Bruckhaus
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Patent number: 10311129Abstract: The present invention extends to methods, systems, and computer program products for detecting events from features derived from multiple signals. In one aspect, an event detection infrastructure determines that characteristics of multiple signals, when considered collectively, indicate an event of interest to one or more parties. In another aspect, an evaluation module determines that characteristics of one or more signals indicate a possible event of interest to one or more parties. A validator then determines that characteristics of one or more other signals validate the possible event as an actual event of interest to the one or more parties. Signal features can be used to compute probabilities of events occurring.Type: GrantFiled: November 29, 2018Date of Patent: June 4, 2019Assignee: Banjo, Inc.Inventors: Damien Patton, Rish Mehta, Tilmann Bruckhaus