Patents by Inventor Tilmann Bruckhaus

Tilmann Bruckhaus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240087104
    Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.
    Type: Application
    Filed: August 3, 2023
    Publication date: March 14, 2024
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
  • Patent number: 11763443
    Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.
    Type: Grant
    Filed: August 30, 2021
    Date of Patent: September 19, 2023
    Assignee: Instrumental, Inc.
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
  • Publication number: 20220335589
    Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.
    Type: Application
    Filed: June 30, 2022
    Publication date: October 20, 2022
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
  • Publication number: 20210390678
    Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.
    Type: Application
    Filed: August 30, 2021
    Publication date: December 16, 2021
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
  • Patent number: 11132787
    Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.
    Type: Grant
    Filed: July 9, 2019
    Date of Patent: September 28, 2021
    Assignee: Instrumental, Inc.
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
  • Publication number: 20210084478
    Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. The dimensionality of a raw signal is reduced into a normalized signal that includes a probability value. The probability value at least approximates a probability that the normalized signal indicates that a real-world event of a specified event type is occurring. Based on the at least approximated probability, the real-world event of the specified event type is detected as a possible planned event occurring at a venue. The possible planned event is validated as an actual planned event. Validation can include validating data associated with the possible planned event with data from an event planning system associated with the venue. An entity is electronically notified that the actual planned event is occurring.
    Type: Application
    Filed: November 23, 2020
    Publication date: March 18, 2021
    Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
  • Patent number: 10848951
    Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. The dimensionality of a raw signal is reduced into a normalized signal that includes a probability value. The probability value at least approximates a probability that the normalized signal indicates that a real-world event of a specified event type is occurring. Based on the at least approximated probability, the real-world event of the specified event type is detected as a possible planned event occurring at a venue. The possible planned event is validated as an actual planned event. Validation can include validating data associated with the possible planned event with data from an event planning system associated with the venue. An entity is electronically notified that the actual planned event is occurring.
    Type: Grant
    Filed: January 13, 2020
    Date of Patent: November 24, 2020
    Assignee: safeXai, Inc.
    Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
  • Publication number: 20200154258
    Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. The dimensionality of a raw signal is reduced into a normalized signal that includes a probability value. The probability value at least approximates a probability that the normalized signal indicates that a real-world event of a specified event type is occurring. Based on the at least approximated probability, the real-world event of the specified event type is detected as a possible planned event occurring at a venue. The possible planned event is validated as an actual planned event. Validation can include validating data associated with the possible planned event with data from an event planning system associated with the venue. An entity is electronically notified that the actual planned event is occurring.
    Type: Application
    Filed: January 13, 2020
    Publication date: May 14, 2020
    Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
  • Publication number: 20200077247
    Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. A plurality of normalized signals is accessed. Planned event data across the plurality of normalized signals is checked for inconsistencies. Any inconsistencies are resolved in an automated fashion, for example, through reference to databases containing additional information. A planned event can be detected/validated from concurring and/or resolved planned event data. A validator can refer to an event history database and/or a planning system to validate a possible planned event as an actual planned event.
    Type: Application
    Filed: June 27, 2019
    Publication date: March 5, 2020
    Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
  • Patent number: 10575162
    Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. A plurality of normalized signals is accessed. Planned event data across the plurality of normalized signals is checked for inconsistencies. Any inconsistencies are resolved in an automated fashion, for example, through reference to databases containing additional information. A planned event can be detected/validated from concurring and/or resolved planned event data. A validator can refer to an event history database and/or a planning system to validate a possible planned event as an actual planned event.
    Type: Grant
    Filed: June 27, 2019
    Date of Patent: February 25, 2020
    Assignee: Banjo, Inc.
    Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
  • Publication number: 20200013156
    Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.
    Type: Application
    Filed: July 9, 2019
    Publication date: January 9, 2020
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
  • Patent number: 10474733
    Abstract: The present invention extends to methods, systems, and computer program products for detecting events from features derived from multiple signals. In one aspect, an event detection infrastructure determines that characteristics of multiple signals, when considered collectively, indicate an event of interest to one or more parties. In another aspect, an evaluation module determines that characteristics of one or more signals indicate a possible event of interest to one or more parties. A validator then determines that characteristics of one or more other signals validate the possible event as an actual event of interest to the one or more parties. Signal features can be used to compute probabilities of events occurring.
    Type: Grant
    Filed: April 9, 2019
    Date of Patent: November 12, 2019
    Assignee: Banjo, Inc.
    Inventors: Damien Patton, Rish Mehta, Tilmann Bruckhaus
  • Publication number: 20190251139
    Abstract: The present invention extends to methods, systems, and computer program products for detecting events from features derived from multiple signals. In one aspect, an event detection infrastructure determines that characteristics of multiple signals, when considered collectively, indicate an event of interest to one or more parties. In another aspect, an evaluation module determines that characteristics of one or more signals indicate a possible event of interest to one or more parties. A validator then determines that characteristics of one or more other signals validate the possible event as an actual event of interest to the one or more parties. Signal features can be used to compute probabilities of events occurring.
    Type: Application
    Filed: April 9, 2019
    Publication date: August 15, 2019
    Inventors: Damien Patton, Rish Mehta, Tilmann Bruckhaus
  • Publication number: 20190253860
    Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. A plurality of normalized signals is accessed. Planned event data across the plurality of normalized signals is checked for inconsistencies. Any inconsistencies are resolved in an automated fashion, for example, through reference to databases containing additional information. A planned event can be detected/validated from concurring and/or resolved planned event data. A validator can refer to an event history database and/or a planning system to validate a possible planned event as an actual planned event.
    Type: Application
    Filed: January 3, 2019
    Publication date: August 15, 2019
    Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
  • Publication number: 20190251138
    Abstract: The present invention extends to methods, systems, and computer program products for detecting events from features derived from multiple signals. In one aspect, an event detection infrastructure determines that characteristics of multiple signals, when considered collectively, indicate an event of interest to one or more parties. In another aspect, an evaluation module determines that characteristics of one or more signals indicate a possible event of interest to one or more parties. A validator then determines that characteristics of one or more other signals validate the possible event as an actual event of interest to the one or more parties. Signal features can be used to compute probabilities of events occurring.
    Type: Application
    Filed: July 6, 2018
    Publication date: August 15, 2019
    Inventors: Damien Patton, Rish Mehta, Tilmann Bruckhaus
  • Patent number: 10382938
    Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. A plurality of normalized signals is accessed. Planned event data across the plurality of normalized signals is checked for inconsistencies. Any inconsistencies are resolved in an automated fashion, for example, through reference to databases containing additional information. A planned event can be detected/validated from concurring and/or resolved planned event data. A validator can refer to an event history database and/or a planning system to validate a possible planned event as an actual planned event.
    Type: Grant
    Filed: January 3, 2019
    Date of Patent: August 13, 2019
    Assignee: Banjo, Inc.
    Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus
  • Patent number: 10353685
    Abstract: The method for model management includes, within a testing platform: building candidate model(s), validating the candidate model(s), and selectively deploying the candidate model(s) into a production environment. The method can optionally include, within a production environment: detecting a class instance based on the raw data using deployed model(s) within the production environment, and transmitting a notification to an endpoint associated with the detected class.
    Type: Grant
    Filed: January 3, 2019
    Date of Patent: July 16, 2019
    Assignee: Banjo, Inc.
    Inventors: Damien Patton, Tilmann Bruckhaus
  • Publication number: 20190171428
    Abstract: The method for model management includes, within a testing platform: building candidate model(s), validating the candidate model(s), and selectively deploying the candidate model(s) into a production environment. The method can optionally include, within a production environment: detecting a class instance based on the raw data using deployed model(s) within the production environment, and transmitting a notification to an endpoint associated with the detected class.
    Type: Application
    Filed: January 3, 2019
    Publication date: June 6, 2019
    Inventors: Damien Patton, Tilmann Bruckhaus
  • Patent number: 10311129
    Abstract: The present invention extends to methods, systems, and computer program products for detecting events from features derived from multiple signals. In one aspect, an event detection infrastructure determines that characteristics of multiple signals, when considered collectively, indicate an event of interest to one or more parties. In another aspect, an evaluation module determines that characteristics of one or more signals indicate a possible event of interest to one or more parties. A validator then determines that characteristics of one or more other signals validate the possible event as an actual event of interest to the one or more parties. Signal features can be used to compute probabilities of events occurring.
    Type: Grant
    Filed: November 29, 2018
    Date of Patent: June 4, 2019
    Assignee: Banjo, Inc.
    Inventors: Damien Patton, Rish Mehta, Tilmann Bruckhaus
  • Patent number: 10212572
    Abstract: The present invention extends to methods, systems, and computer program products for detecting and validating planned event information. A plurality of normalized signals is accessed. Planned event data across the plurality of normalized signals is checked for inconsistencies. Any inconsistencies are resolved in an automated fashion, for example, through reference to databases containing additional information. A planned event can be detected/validated from concurring and/or resolved planned event data. A validator can refer to an event history database and/or a planning system to validate a possible planned event as an actual planned event.
    Type: Grant
    Filed: September 5, 2018
    Date of Patent: February 19, 2019
    Assignee: Banjo, Inc.
    Inventors: Damien Patton, Joshua J. Newman, Tilmann Bruckhaus