Abstract: A measuring device for a scanning probe microscope including a sample receptacle configured to receive a sample; a measuring probe which is arranged on a probe holder and has a probe tip; a displacement device which moves the measuring probe and the sample receptacle relative to each other; a control device which is connected to the displacement device and controls the relative movement between the measuring probe and the sample receptacle; and a sensor device which is configured to detect, movement measurement signals during an absolute measurement for a movement of the measuring probe and/or a movement of the sample receptacle. The movement measurement signals are relayed to the control device. The control device is configured to control the relative movement. The invention also provides a scanning probe microscope, as well as a method for examining a sample.

Abstract: A measuring device for a scanning probe microscope including a sample receptacle configured to receive a sample; a measuring probe which is arranged on a probe holder and has a probe tip; a displacement device which moves the measuring probe and the sample receptacle relative to each other; a control device which is connected to the displacement device and controls the relative movement between the measuring probe and the sample receptacle; and a sensor device which is configured to detect, movement measurement signals during an absolute measurement for a movement of the measuring probe and/or a movement of the sample receptacle. The movement measurement signals are relayed to the control device. The control device is configured to control the relative movement. The invention also provides a scanning probe microscope, as well as a method for examining a sample.

Abstract: A sample carrier suitable for receiving a sample, a first investigation device for investigating the sample and having a first optical beam path for a first measurement light, a second investigation device for investigating the sample and having a second optical beam path for a second measurement light, wherein the first or the second investigation device comprises a probe microscope suitable for investigating the sample and an optical component having a light-permeable section for the first measurement light and an at least partially reflecting section for the second measurement light and disposed in the first and in the second beam path such that the first optical beam path is formed by a material of the optical component in the light-permeable section and that the second optical beam path is formed with a light-reflecting deflection at the at least one partially reflecting section is provided. An associated method is also provided.

Abstract: A sample carrier suitable for receiving a sample, a first investigation device for investigating the sample and having a first optical beam path for a first measurement light, a second investigation device for investigating the sample and having a second optical beam path for a second measurement light, wherein the first or the second investigation device comprises a probe microscope suitable for investigating the sample and an optical component having a light-permeable section for the first measurement light and an at least partially reflecting section for the second measurement light and disposed in the first and in the second beam path such that the first optical beam path is formed by a material of the optical component in the light-permeable section and that the second optical beam path is formed with a light-reflecting deflection at the at least one partially reflecting section is provided. An associated method is also provided.

Abstract: A temperature measuring device includes a temperature sensor and at least two printed circuit boards connected together and extending transversely to one another for establishing an electrical connection between the temperature sensor and a connecting cable.

Abstract: An arrangement for the detection of fluorescent light with at least one imaging microscope unit and at least one device component for analyzing molecular interactions in small volumes, wherein measurement locations for the analysis of molecular interaction are determined and selected in at least two dimensions by the imaging method; the imaging microscope unit and the device components are operated with a shared control unit; and at least the analysis results of the device component are graphically depicted via the control unit and a computer.

Abstract: A temperature measuring device includes a temperature sensor and at least two printed circuit boards connected together and extending transversely to one another for establishing an electrical connection between the temperature sensor and a connecting cable.

Abstract: An arrangement for the detection of fluorescent light with at least one imaging microscope unit and at least one device component for analyzing molecular interactions in small volumes, wherein in that measurement locations for the analysis of molecular interaction are determined and selected in at least two dimensions by the imaging method; the imaging microscope unit and the device components are operated with a shared control unit; and at least the analysis results of the device component are graphically depicted via the control unit and a computer.