Abstract: The invention relates to a method for capturing images of a preferably structured surface of an object, using at least one line-scan camera for scanning the surface, wherein the surface is illuminated in a structured manner and wherein for reconstruction of the surface a time-oriented evaluation and/or spatial evaluation of acquired images is effected optionally taking into account a relative movement between the line-scan camera and the surface. Said method is carried out by a device for capturing images of a preferably structured surface of an object.

Abstract: The invention relates to a method for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data. A surface description, at least portions of which are parametric, is generated as a target surface model using the specified reference data, and the comparison is carried out using the target surface model and the measured data. The invention likewise relates to a device for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data.

Abstract: According to the invention, a method for detecting and measuring local shape deviations in flat, curved, or domed surfaces of a test object, wherein three-dimensional measurement data (D) of the surfaces are evaluated by means of an evaluating apparatus, is designed and further developed, with regard to nondestructive testing of test objects with objective and easy-to-interpret assessment results, in such a way that the evaluating apparatus uses at least one virtual filter element as a concave filter for detecting concave sub-areas in flat or convex surfaces and/or as a convex filter for detecting convex sub-areas in flat or concave surfaces, that the filter element determines magnitudes of the shape deviations, and that said magnitudes are output by means of an outputting apparatus as measured values. The invention specifies a device for performing a corresponding method.

Abstract: The invention relates to a method for capturing images of a preferably structured surface of an object, using at least one line-scan camera for scanning the surface, wherein the surface is illuminated in a structured manner and wherein for reconstruction of the surface a time-oriented evaluation and/or spatial evaluation of acquired images is effected optionally taking into account a relative movement between the line-scan camera and the surface. Said method is carried out by a device for capturing images of a preferably structured surface of an object.

Abstract: The invention relates to a method for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data. A surface description, at least portions of which are parametric, is generated as a target surface model using the specified reference data, and the comparison is carried out using the target surface model and the measured data. The invention likewise relates to a device for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data.

Abstract: A method for detecting and measuring local deviations from the form in planar, curved, or arched surfaces of a test object is provided, whereby three-dimensional measurements (D) of the surfaces are processed with an evaluation unit, embodied and further developed with regards to a non-destructive examination of test objects with objective and easily interpreted assessment results such that the evaluation device uses at least one virtual filter element as a concave filter for detecting concave partial areas in planar or convex surfaces and/or as a convex filter for detecting convex partial areas in planar or concave surfaces, that the filter element determines values of the deviations from the form, and that they are displayed via a display device in the form of measurements. A device for executing a respective method is provided.

Abstract: A device for three-dimensional optical measurement of surfaces of arbitrary objects (2) using a pattern projection method, with a projector (3) for projecting patterns onto the surface (1) of the object (2), at least one camera (5) or imaging unit for recording the projected pattern and a computer for processing the image information recorded by the camera or the imaging unit to form 3D data, optionally for three-dimensional imaging of the object (2), is characterized in that the projector (3) only emits narrowband light and in that a filter apparatus is arranged in the detection beam path in front of the camera (5) or imaging unit, which filter apparatus is only transmissive to the wavelength range of the light emitted by the projector (3). A method application of the device according to the invention has a corresponding design.

Abstract: The invention relates to a method of detecting flaws in the surface of a test object relative to the surface of a flawless master part by constructing in an artificial neuronal net a virtual master part for comparison with characteristic numbers derived from the grey values of sequential images of the test object recorded by a digital camera.

Abstract: A method of defining deviations from a desired position of pixel sites in an image recording matrix by defining the 3-D data of a planar or slightly curved surface. To the extent necessary the results are smoothed, and the measuring points, utilizing the 3-D data, are projected back the sensors of the image recording matrix for determining the difference between the two points projected onto the sensors and associated with a 3-D measuring point. After selectively shifting the surface relative to the 3-D measuring system, prior method steps are repeated until the desired accuracy in the definition of the deviation has been has been attained.

Abstract: A method of defining deviations from a desired position of pixel sites in an image recording matrix by defining the 3-D data of a planar or slightly curved surface. To the extent necessary the results are smoothed, and the measuring points, utilizing the 3-D data, are projected back the sensors of the image recording matrix for determining the difference between the two points projected onto the sensors and associated with a 3-D measuring point. After selectively shifting the surface relative to the 3-D measuring system, prior method steps are repeated until the desired accuracy in the definition of the deviation has been has been attained.

Abstract: A method of improving the accuracy of optical 3-D measuring method utilizing a matrix camera provided with an image recording matrix of known pixel raster width of pitch for generating an image by measuring for all pixels or a selected portion thereof the individual deviation of the pixel site relative to a desired position for determining on the basis thereof the individual exact pixel sites and taking them into consideration for the calculation of the 3-D data.

Abstract: The invention relates to a method of detecting flaws in the surface of a test object relative to the surface of a flawless master part by constructing in an artificial neuronal net a virtual master part for comparison with characteristic numbers derived from the grey values of sequential images of the test object recorded by a digital camera.