Patents by Inventor Tim A. Beerling

Tim A. Beerling has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6039438
    Abstract: A crack or delamination occurring within a thin film structure of a printhead is limited to a local region by strategically locating openings within the thin film structure. The etched openings serve to partially isolate each nozzle chamber. The openings are etched in passivation and other layers of the thin film to limit the propagation of the crack or delamination. As thermal stresses re-occur the crack or delamination extends. In may cases the crack or delamination eventually extends to the etched opening. The crack or delamination then ceases its propagation, in effect being blocked by the etched opening. By including an etched opening within the thin film near each nozzle chamber, a given nozzle chamber is isolated from a crack or delamination in the thin film at an adjacent or nearby nozzle. Reliability of a given nozzle therefore is less dependent upon the reliability of an adjacent nozzle.
    Type: Grant
    Filed: October 21, 1997
    Date of Patent: March 21, 2000
    Assignee: Hewlett-Packard Company
    Inventor: Tim Beerling
  • Patent number: 5919293
    Abstract: An ink-jet ink composition and a method for printing are provided which involve the use of at least one perfluorinated solvent as part or all of the vehicle of the ink-jet ink. The ink-jet ink composition evidences improved bleed control, reduced paper cockle and curl, and reduced dry time upon printing onto a print medium. The use of perfluorinated solvents reduces or even eliminates material compatibility issues between the ink and the materials comprising the pen from which the ink is ejected.
    Type: Grant
    Filed: October 31, 1997
    Date of Patent: July 6, 1999
    Assignee: Hewlett-Packard Company
    Inventors: John R. Moffatt, Tim A. Beerling, David A. Neel