Patents by Inventor Tim Dahmen

Tim Dahmen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for testing samples by means of an electron or ion beam microscope
    Patent number: 10319559
    Abstract: The disclosed subject matter relates to testing a sample by means of a particle beam microscope in which the sample is scanned in a point-wise manner by a focused beam of charged particles thereby generating imaging signals. The particle beam dose applied per scanning point is changed during scanning.
    Type: Grant
    Filed: September 6, 2016
    Date of Patent: June 11, 2019
    Inventors: Tim Dahmen, Niels de Jonge
  • Method and Device for Testing Samples by Means of an Electron or Ion Beam Microscope
    Publication number: 20170154754
    Abstract: The disclosed subject matter relates to testing a sample by means of a particle beam microscope in which the sample is scanned in a point-wise manner by a focused beam of charged particles thereby generating imaging signals. The particle beam dose applied per scanning point is changed during scanning.
    Type: Application
    Filed: September 6, 2016
    Publication date: June 1, 2017
    Inventors: Tim Dahmen, Niels de Jonge