Abstract: A measuring system for measuring an ion concentration in a process liquid using capillary electrophoresis. The system includes a feeding line extending between a first and a second end, wherein the feeding line has a flow direction from the first to the second end, an inlet connected to the feeding line at the first end, a pump in the feeding line, an expansion vessel connected to the feeding line with an expansion line, where the expansion line is provided with a first valve, and a capillary electrophoresis measuring device that is connected to the feeding line at the second end. The pump, the first valve and the expansion vessel cooperate to build up and release pressure for loading samples in the capillary electrophoresis measuring device.

Abstract: A monocrystalline layer of one semiconductor material is grown onto a surface of a monocrystalline semiconductor body by means of molecular beam epitaxy. During such growth, the semiconductor body is kept at such a low temperature that a non-monocrystalline layer is obtained. The non-monocrystalline layer is then converted by a heat treatment into a monocrystalline form. Accordingly, an abrupt junction between the two semiconductor materials is obtained.