Patents by Inventor Tim Heek

Tim Heek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Handheld X-ray fluorescence, XRF, analyzer and a method for elemental analysis with a handheld XRF analyzer
    Patent number: 12782302
    Abstract: The present disclosure refers to a handheld X-ray fluorescence, XRF, analyzer (1). The XRF analyzer (1) comprises a radiation source assembly (10) configured to irradiate a sample (40) to be tested with an X-ray beam (105), a radiation detector assembly (20) configured to detect a first X-Ray fluorescence, XRF, radiation (205) emitted from the sample (40) in response to the X-ray beam (105), a purge assembly configured for purging through a port connection, a magnet (30) configured to deflect electrons such that they do not reach the radiation detector assembly (20) and a processor configured to determine a property of the sample (40) to be tested from the first X-ray fluorescence, XRF, radiation (205). The present disclosure further refers to a method for elemental analysis with a handheld XRF analyzer (1).
    Type: Grant
    Filed: October 15, 2024
    Date of Patent: November 3, 2026
    Assignee: Bruker Nano GmbH
    Inventors: Tim Heek, Timo Wolff
  • Handheld X-ray fluorescence, XRF, analyzer and a method for elemental analysis with a handheld XRF analyzer
    Publication number: 20250172513
    Abstract: The present disclosure refers to a handheld X-ray fluorescence, XRF, analyzer (1). The XRF analyzer (1) comprises a radiation source assembly (10) configured to irradiate a sample (40) to be tested with an X-ray beam (105), a radiation detector assembly (20) configured to detect a first X-Ray fluorescence, XRF, radiation (205) emitted from the sample (40) in response to the X-ray beam (105), a purge assembly configured for purging through a port connection, a magnet (30) configured to deflect electrons such that they do not reach the radiation detector assembly (20) and a processor configured to determine a property of the sample (40) to be tested from the first X-ray fluorescence, XRF, radiation (205). The present disclosure further refers to a method for elemental analysis with a handheld XRF analyzer (1).
    Type: Application
    Filed: October 15, 2024
    Publication date: May 29, 2025
    Applicant: Bruker Nano GmbH
    Inventors: Tim Heek, Timo Wolff