Patents by Inventor Tim Messang

Tim Messang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Temperature measurement of active device under test on strip tester
    Patent number: 8547122
    Abstract: A plurality of devices under test (DUT) are arranged in a strip tester having a temperature controlled heater block. Each DUT has a respective set of electrical test probes and a thermally conductive test probe for electrically and thermally coupling, respectively, of the strip tester to the DUTs. Temperature measurement of each of the plurality of DUTs is performed by a temperature measuring device. The temperature measuring device can be part of the test board of the strip tester and will be in thermal communications with the DUT through the thermally conductive test probe, or temperature of the DUT can be measurement with an RTD embedded in the thermally conductive test probe, thereby providing faster thermal response time.
    Type: Grant
    Filed: July 11, 2011
    Date of Patent: October 1, 2013
    Assignee: Microchip Technology Incorporated
    Inventors: Ronaldo Francisco, Chi Lung Wong, Tim Messang, Ezana Haile Aberra
  • TEMPERATURE MEASUREMENT OF ACTIVE DEVICE UNDER TEST ON STRIP TESTER
    Publication number: 20130015869
    Abstract: A plurality of devices under test (DUT) are arranged in a strip tester having a temperature controlled heater block. Each DUT has a respective set of electrical test probes and a thermally conductive test probe for electrically and thermally coupling, respectively, of the strip tester to the DUTs. Temperature measurement of each of the plurality of DUTs is performed by a temperature measuring device. The temperature measuring device can be part of the test board of the strip tester and will be in thermal communications with the DUT through the thermally conductive test probe, or temperature of the DUT can be measurement with an RTD embedded in the thermally conductive test probe, thereby providing faster thermal response time.
    Type: Application
    Filed: July 11, 2011
    Publication date: January 17, 2013
    Inventors: Ronaldo Francisco, Chi Lung Wong, Tim Messang, Ezana Haile Aberra