Abstract: A device includes a PWM circuit to generate a complementary PWM signal comprised of a positive polarity PWM signal and a negative polarity PWM signal. The positive polarity signal may drive a high-side switch. A trigger multiplexer may take as input the negative polarity PWM signal and may force an output based on a predetermined condition, the predetermined condition including but not limited to the maximum on-time of a low-side switch. The output of the trigger multiplexer may drive a low-side switch. The high-side switch and the low-side switch may drive a load.

Abstract: Logic circuits of a digital device may be biased to operate over specific external clock frequency ranges by programming a desired clock oscillator frequency range into a configuration memory of the digital device. In addition, clock source selection may also be programmed into the configuration register. Bias circuits are then configured so that the internal logic of the digital device will operate over the desired clock oscillator frequency range. Non-volatile memory may be used to store the contents of the configuration memory so as to retain the configuration during power down of the digital device. The non-volatile memory may be programmable fuse links, electrically erasable and programmable memory (EEPROM), FLASH memory, etc.

Abstract: A mixed signal device having an analog-to-digital converter (ADC) with offset and gain calibration using internal voltage references whereby the digital processor calibrates out offset and gain errors in the analog-to-digital converter by adjusting the analog input amplifier gain and offset or with software compensating the digital representations of the voltages measured. Two different known voltage values are used in determining the offset and gain adjustments needed to calibrate the ADC against the two know voltage values. The mixed signal device may further comprise a Bandgap voltage reference having an accurate known voltage value. Wherein the Bandgap voltage reference may be used for further offset and gain calibration of the ADC to produce substantially absolute voltage values.

Abstract: A mixed signal device having an analog-to-digital converter (ADC) with offset and gain calibration using internal voltage references whereby the digital processor calibrates out offset and gain errors in the analog-to-digital converter by adjusting the analog input amplifier gain and offset or with software compensating the digital representations of the voltages measured. Two different known voltage values are used in determining the offset and gain adjustments needed to calibrate the ADC against the two know voltage values. The mixed signal device may further comprise a Bandgap voltage reference having an accurate known voltage value. Wherein the Bandgap voltage reference may be used for further offset and gain calibration of the ADC to produce substantially absolute voltage values.

Abstract: Logic circuits of a digital device may be biased to operate over specific external clock frequency ranges by programming a desired clock oscillator frequency range into a configuration memory of the digital device. In addition, clock source selection may also be programmed into the configuration register. Bias circuits are then configured so that the internal logic of the digital device will operate over the desired clock oscillator frequency range. Non-volatile memory may be used to store the contents of the configuration memory so as to retain the configuration during power down of the digital device. The non-volatile memory may be programmable fuse links, electrically erasable and programmable memory (EEPROM), FLASH memory, etc.

Abstract: A high voltage data latch with complementary outputs that are each set to one of two voltage levels (V.sub.pp and V.sub.b). The high voltage data latch is designed using CMOS technology wherein no PMOS transistors have a voltage level greater than V.sub.pp /2 volts across any node. This will allow PMOS transistors with lower voltage breakdown levels to be used. The high voltage data latch has two modes of operation. In a low voltage mode (V.sub.pp =V.sub.DD and V.sub.b =Ground) the outputs switch with respect to the inputs. In a high voltage mode (V.sub.pp >V.sub.b >V.sub.dd) the outputs will be latched to the state they were in when the voltage rails changed states from the low voltage mode to the high voltage mode.