Abstract: This invention provides novel methods and compositions for modulating T cell differentiation and T cell responses. The modulators are identified by screening test compounds for ability to modulate an inositol 1,4,5-trisphosphate 3-kinase (IP3K). The IP3K modulators can be further examined for their activity in modulating development of progenitor T cells (e.g., CD4+/CD8+ double positive T cells) into mature CD4+ or CD8+ single positive T cells. Pharmaceutical compositions comprising these T cell modulators can be administered to a subject to modulate T cell immune responses, to suppress inflammations, and to treat disease conditions such as autoimmune diseases, graft rejection or allergies.

Abstract: This invention provides novel methods and compositions for modulating T cell differentiation and T cell responses. The modulators are identified by screening test compounds for ability to modulate an inositol 1,4,5-trisphosphate 3-kinase (IP3K). The IP3K modulators can be further examined for their activity in modulating development of progenitor T cells (e.g., CD4+/CD8+ double positive T cells) into mature CD4+ or CD8+ single positive T cells. Pharmaceutical compositions comprising these T cell modulators can be administered to a subject to modulate T cell immune responses, to suppress inflammations, and to treat disease conditions such as autoimmune diseases, graft rejection or allergies.

Abstract: An optical alignment system used in the manufacture of semiconductor integrated circuits determines and adjusts the alignment between features which have been formed on a semiconductor wafer and features on a mask which is being projected onto the semiconductor wafer. Light which illuminates the semiconductor wafer is scattered and diffracted into a dark-field detector system. This results in the generation of electrical signals which are used to position the mask relative to the semiconductor wafer. The use of polarized light in the present system results in an increase in the magnitude of the desired signals and a decrease in the magnitude of the spurious signals. To improve the quality of the signals, the angle of polarization of the light is adjusted to a specific relationship with respect to the geometry of the alignment marks on the semiconductor wafer.