Patents by Inventor TIMOTHY A. BARTSCH

TIMOTHY A. BARTSCH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Detecting and correcting deficiencies in surface conditions for bonding applications
    Patent number: 11268809
    Abstract: A method adjusts a mechanical process on a material in order to improve bonding characteristics of the material. A system collects surface micro-roughness measurements of a material, and places discrete sampling regions on the material. The system analyzes the surface micro-roughness measurements for each of the discrete sampling regions on the material, and identifies a lowest micro-roughness measurement in a discrete sampling region from a plurality of discrete sampling regions on the material. The system compares the lowest micro-roughness measurement to a threshold micro-roughness measurement in order to determine that the lowest micro-roughness measurement is less than the threshold micro-roughness measurement.
    Type: Grant
    Filed: November 7, 2018
    Date of Patent: March 8, 2022
    Assignee: International Business Machines Corporation
    Inventors: Jennifer Bennett, James D. Bielick, David J. Braun, Timothy P. Younger, Theron L. Lewis, Stephen M. Hugo, John R. Dangler, Timothy A. Bartsch
  • DETECTING AND CORRECTING DEFICIENCIES IN SURFACE CONDITIONS FOR BONDING APPLICATIONS
    Publication number: 20200141726
    Abstract: A method adjusts a mechanical process on a material in order to improve bonding characteristics of the material. A system collects surface micro-roughness measurements of a material, and places discrete sampling regions on the material. The system analyzes the surface micro-roughness measurements for each of the discrete sampling regions on the material, and identifies a lowest micro-roughness measurement in a discrete sampling region from a plurality of discrete sampling regions on the material. The system compares the lowest micro-roughness measurement to a threshold micro-roughness measurement in order to determine that the lowest micro-roughness measurement is less than the threshold micro-roughness measurement.
    Type: Application
    Filed: November 7, 2018
    Publication date: May 7, 2020
    Inventors: JENNIFER BENNETT, JAMES D. BIELICK, DAVID J. BRAUN, TIMOTHY P. YOUNGER, THERON L. LEWIS, STEPHEN M. HUGO, JOHN R. DANGLER, TIMOTHY A. BARTSCH