Abstract: This disclosure describes, in part, techniques for sharing content associated with network applications. For instance, a user may want to share content for a network application, such as a game stream for a gaming application. As such, system(s) may launch a broadcasting session on a first virtual server and launch the network application on a second virtual server. The first virtual server may then receive content data representing states of the network application from the second virtual server. Additionally, the first virtual server may receive video data representing the user and/or audio data representing user speech from a user device. The first virtual server may then generate broadcasting data using the content data, the video data, and the audio data. After generating the broadcasting data, the system(s) may send the broadcasting data to one or more computing devices associated with a user account.

Abstract: This disclosure describes, in part, techniques for sharing content associated with network applications. For instance, a user may want to share content for a network application, such as a game stream for a gaming application. As such, system(s) may launch a broadcasting session on a first virtual server and launch the network application on a second virtual server. The first virtual server may then receive content data representing states of the network application from the second virtual server. Additionally, the first virtual server may receive video data representing the user and/or audio data representing user speech from a user device. The first virtual server may then generate broadcasting data using the content data, the video data, and the audio data. After generating the broadcasting data, the system(s) may send the broadcasting data to one or more computing devices associated with a user account.

Abstract: Disclosed are apparatuses and methods for non-contact processing a substrate, for example a glass substrate, overtop a gas layer. The support apparatus includes a plurality of gas bearings positioned on a pressure box supplied with a pressurized gas. Some embodiments are directed to a method of supporting and transporting softened glass. The method includes placing the glass in proximity to a gas bearing device having a support surface with a plurality of outlet ports disposed therein. Some embodiments are in directed to a glass processing apparatus comprising an air table configured to continuously transport and support a stream of glass and a plurality of modular devices supported by a support structure and disposed above the air table. Some embodiments are directed to a method for flattening viscous glass using a two-sided gas bearing device or a one-sided gas bearing device.

Abstract: A device includes a housing constructed from a conductive material, and an electronic circuit electrically insulated from the housing. The device also includes a power source positioned such that a first electrical contact of the power source faces the electronic circuit and a second electrical contact faces a side of the housing. The device also includes an insulating layer that includes a first aperture and a second aperture. The device also includes a first connector configured for electrically coupling the electronic circuit and the first electrical contact, and a second connector configured for electrically coupling the electronic circuit and the side of the housing via the first aperture of the insulating layer. The power source is configured for electrically coupling the second electrical contact with the side of the housing via the second aperture of the insulating layer.

Abstract: A device includes a housing constructed from a conductive material, and an electronic circuit electrically insulated from the housing. The device also includes a power source positioned such that a first electrical contact of the power source faces the electronic circuit and a second electrical contact faces a side of the housing. The device also includes an insulating layer that includes a first aperture and a second aperture. The device also includes a first connector configured for electrically coupling the electronic circuit and the first electrical contact, and a second connector configured for electrically coupling the electronic circuit and the side of the housing via the first aperture of the insulating layer. The power source is configured for electrically coupling the second electrical contact with the side of the housing via the second aperture of the insulating layer.

Abstract: A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

Abstract: Methods of sustainable wastewater and biosolids treatment using a bioreactor including a microbial fuel cell are disclosed. In some embodiments, the methods include the following: enriching an anode of the microbial fuel cell in the bioreactor with a substantially soluble electron acceptor; growing the bacteria in the presence of the anode enriched with a substantially soluble electron acceptor; oxidizing a substrate using the bacteria to produce free electrons; channeling the free electrons away from a terminal electron acceptor and to the enriched anode, the enriched anode serving as an electron acceptor; and carrying the free electrons from the enriched anode to a cathode of the microbial fuel cell to generate electricity.

Abstract: A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

Abstract: A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

Abstract: A system and method for measurement are disclosed which may include providing an input command signal; convolving the input command signal with a plurality of impulse signals to produce a transducer drive signal; and activating a first pressure transducer with the drive signal to transmit a pressure wave output from the transducer.

Abstract: A system and method for measurement are disclosed which may include providing an input command signal; convolving the input command signal with a plurality of impulse signals to produce a transducer drive signal; and activating a first pressure transducer with the drive signal to transmit a pressure wave output from the transducer.

Abstract: Techniques for the delivery of metered amounts of liquid material include the use of a pin, such as an optical fiber. A sample of the liquid material may be placed on the tip of the pin for delivery to a target area, such as a specific location on a microarray, in a contactless manner. Light transmitted through the pin may be detected to facilitate accurate measuring of the pin's position.

Abstract: Techniques for the delivery of metered amounts of liquid material include the use of a pin, such as an optical fiber. A sample of the liquid material may be placed on the tip of the pin for delivery to a target area, such as a specific location on a microarray, in a contactless manner. Light transmitted through the pin may be detected to facilitate accurate measuring of the pin's position.

Abstract: A venturi mixing system mixes intake air with exhaust gases for exhaust gas recirculation (EGR) in an internal combustion engine. The venturi mixing system has a venturi disposed in a mixing conduit. The venturi is connected to an intake air conduit and a supply conduit. The venturi and mixing conduit form an annular cavity connected to an EGR conduit. The venturi forms a mixing chamber. One or more inset conduits connect to the venturi and extend into the mixing chamber. Each inset conduit has an end outlet and one or more side outlets. The venturi generates a lower pressure region in the intake air. The inset conduits generate a turbulence field in the lower pressure region. The inset conduits direct intake air into the turbulence field. The inset conduits direct exhaust gases through the end and side outlets into the turbulence field. The exhaust gases mix with the intake air in the turbulence field to form a combustion gas for combustion of fuel in the engine.

Abstract: A venturi mixing system mixes intake air with exhaust gases for exhaust gas recirculation (EGR) in an internal combustion engine. The venturi mixing system has a venturi disposed in a mixing conduit. The venturi is connected to an intake air conduit and a supply conduit. The venturi and mixing conduit form an annular cavity connected to an EGR conduit. The venturi forms a mixing chamber. One or more inset conduits connect to the venturi and extend into the mixing chamber. Each inset conduit has an end outlet and one or more side outlets. The venturi generates a lower pressure region in the intake air. The inset conduits generate a turbulence field in the lower pressure region. The inset conduits direct intake air into the turbulence field. The inset conduits direct exhaust gases through the end and side outlets into the turbulence field. The exhaust gases mix with the intake air in the turbulence field to form a combustion gas for combustion of fuel in the engine.

Abstract: Simultaneous pressure and position information is accurately measured in a sensor realized by utilizing first and second sensor elements that each exhibit a decreasing width over the length of the sensor element and that are arranged overlapping each other and in a substantially complementary orientation to one another with respect to the width so that the point of narrowest width of the first sensor element overlaps the point of the widest width of the second sensor element. Pressure applied to the sensor causes each sensor element to generate an electrical signal that is proportional to both the applied pressure and the surface area at the location of the applied pressure. As a result of the complementary orientation and overlapping for these sensor elements, the first and second sensor elements generate an asymmetric pair of signals that uniquely define the applied pressure by position and magnitude.

Abstract: An efficient method and apparatus for characterizing circuit devices is disclosed. In one embodiment, multiple test patterns for testing a circuit device are stored in a tester. Each test pattern includes both test data and control data that defines at least in part a sweep point at which the circuit device is tested. Thus, the tester can generate stimulus vectors for multiple sweep points without requiring control system intervention. Pass/fail indicators, each of which represents pass/fail results associated with a sweep point, are derived from the test results and stored in a Fail Capture Memory. A pass/fail boundary of the DUT can be determined from the contents of the Fail Capture Memory.

Abstract: A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

Abstract: An apparatus comprises a duct having a fluid outlet for fluid propelled through the duct and a container positions a substance for diffusion into the fluid through an opening. A movable valve selectively places the opening in fluid communication with the fluid in the duct and seals the opening to prevent introduction of the substance into the fluid. In a particularly advantageous embodiment the apparatus is a blow dryer in which a heating element disposed in the duct heats air flowing therethrough. The substance can be a fragrance or a conditioner introduced into the air stream. According to other aspects of the invention, the container is interchangeable with containers containing other substances, such as different fragrances, and is completely sealed when the blow dryer is not in use. In another embodiment, a container attached to the duct ejects the substance in a spray external of the duct proximate to the duct outlet.

Abstract: Techniques for the delivery of metered amounts of liquid material include the use of a pin, such as an optical fiber. A sample of the liquid material may be placed on the tip of the pin for delivery to a target area, such as a specific location on a microarray, in a contactless manner. Light transmitted through the pin may be detected to facilitate accurate measuring of the pin's position.