Abstract: A method of inspecting an object including locating an object on a machine vision apparatus, attaching a light panel to the object to backlight a region of the object, obtaining an image of the region when backlit by the light panel and identifying a geometric property of the object from the image.

Abstract: A method of inspecting an object with a camera probe for capturing an image of an object, the camera probe being movable along a path by a measurement apparatus, at least a part of the camera probe being rotatable about at least one axis. The method includes: a) the measurement apparatus moving the camera probe relative to the object along an inspection path and b) for at least one period as the camera probe moves along the inspection path: turning at least a part of the camera probe about the at least one axis thereby slowing the passage of a feature of interest on the object across the camera probe's field of view; and capturing at least one image of the feature of interest during at least a portion of the turning.

Abstract: A method of inspecting an object with a camera probe for capturing an image of an object, the camera probe being movable along a path by a measurement apparatus, at least a part of the camera probe being rotatable about at least one axis. The method includes: a) the measurement apparatus moving the camera probe relative to the object along an inspection path and b) for at least one period as the camera probe moves along the inspection path: turning at least a part of the camera probe about the at least one axis thereby slowing the passage of a feature of interest on the object across the camera probe's field of view; and capturing at least one image of the feature of interest during at least a portion of the turning.

Abstract: A method of inspecting an object including locating an object on a machine vision apparatus, attaching a light panel to the object to backlight a region of the object, obtaining an image of the region when backlit by the light panel and identifying a geometric property of the object from the image.

Abstract: A non-contact method and apparatus for inspecting an object via phase analysis. A projector projects an optical pattern onto the surface of an object to be inspected. At least first and second images of the surface on which the optical pattern is projected are then obtained. The phase of the optical pattern at the surface is changed between the first and second image by moving the projector relative to the object.

Abstract: A method of operating a vision measurement probe for obtaining and supplying images of an object to be measured. The vision measurement probe is mounted on a continuous articulating head of a coordinate positioning apparatus, and the continuous articulating head having at least one rotational axis. The object and vision measurement probe can be moved relative to each other about the at least one rotational axis and in at least one linear degree of freedom during a measuring operation. The method includes: processing at least one image obtained by the vision measurement probe to obtain feedback data; and controlling the physical relationship between the vision measurement probe and the object based on said feedback data.

Abstract: A non-contact method and apparatus for inspecting an object via phase analysis. A projector projects an optical pattern onto the surface of an object to be inspected. At least first and second images of the surface on which the optical pattern is projected are then obtained. The phase of the optical pattern at the surface is changed between the first and second image by moving the projector relative to the object.