Patents by Inventor Timothy E. Lesher

Timothy E. Lesher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe testing structure
    Patent number: 8069491
    Abstract: A calibration structure for probing devices.
    Type: Grant
    Filed: June 20, 2007
    Date of Patent: November 29, 2011
    Assignee: Cascade Microtech, Inc.
    Inventor: Timothy E. Lesher
  • Probe testing structure
    Publication number: 20080218187
    Abstract: A calibration structure for probing devices.
    Type: Application
    Filed: June 20, 2007
    Publication date: September 11, 2008
    Inventor: Timothy E. Lesher
  • Probe testing structure
    Patent number: 7250626
    Abstract: A calibration structure for probing devices.
    Type: Grant
    Filed: March 5, 2004
    Date of Patent: July 31, 2007
    Assignee: Cascade Microtech, Inc.
    Inventor: Timothy E. Lesher