Patents by Inventor Timothy G. Wengender

Timothy G. Wengender has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Detecting and classifying blemishes on the transmissive surface of an image sensor package
    Patent number: 7103208
    Abstract: A method for determining blemishes in or on the transmissive surface of an image sensor package and determining if such blemishes are acceptable for use of the image sensor package including capturing a digital image of a predetermined scene using the image sensor package and storing such digital image in a memory, identifying blemishes formed in or on the transmissive surface by processing the digital image data using a series of image processing functions, and classifying the blemishes from the digital image and determining if the image sensor package is acceptable for use.
    Type: Grant
    Filed: August 26, 2002
    Date of Patent: September 5, 2006
    Assignee: Eastman Kodak Company
    Inventors: Timothy G. Wengender, Paul D. Conaway
  • Providing a partial column defect map for a full frame image sensor
    Patent number: 6987577
    Abstract: A method for determining defects in an image sensor, which identifies one or more partial column defects, including capturing a digital image using the image sensor and storing such digital image in a memory; identifying at least one column in the digital image which has corrupted data caused by one or more defective pixels in the image sensor; processing the digital image data from the at least one identified column using an extended differentiation filter; and using the output of the extended differentiation filter to identify a starting position or an ending position of the partial column defect.
    Type: Grant
    Filed: September 14, 2001
    Date of Patent: January 17, 2006
    Assignee: Eastman Kodak Company
    Inventor: Timothy G. Wengender
  • Detecting and classifying blemishes on the transmissive surface of an image sensor package
    Publication number: 20040037457
    Abstract: A method for determining blemishes in or on the transmissive surface of an image sensor package and determining if such blemishes are acceptable for use of the image sensor package including capturing a digital image of a predetermined scene using the image sensor package and storing such digital image in a memory, identifying blemishes formed in or on the transmissive surface by processing the digital image data using a series of image processing functions, and classifying the blemishes from the digital image and determining if the image sensor package is acceptable for use.
    Type: Application
    Filed: August 26, 2002
    Publication date: February 26, 2004
    Applicant: Eastman Kodak Company
    Inventors: Timothy G. Wengender, Paul D. Conaway
  • Producing a defective pixel map from defective cluster pixels in an area array image sensor
    Publication number: 20030179418
    Abstract: A method for determining one or more defective pixels in an area array image sensor wherein such defects can form a defective cluster and for producing a defect map which can be used in a digital camera for image correction includes capturing a digital image using the image sensor and storing such digital image in a memory; identifying a plurality of defective pixels which form a defective cluster in the digital image by processing the digital image data using a localized averaging filter; and forming a map identifying the location of the defective cluster in the digital image.
    Type: Application
    Filed: March 19, 2002
    Publication date: September 25, 2003
    Applicant: Eastman Kodak Company
    Inventors: Timothy G. Wengender, Mark A. Newhouse, Eric J. Meisenzahl, James E. McGarvey
  • Providing a partial column defect map for a full frame image sensor
    Publication number: 20030053142
    Abstract: A method for determining defects in an image sensor, which identifies one or more partial column defects, including capturing a digital image using the image sensor and storing such digital image in a memory; identifying at least one column in the digital image which has corrupted data caused by one or more defective pixels in the image sensor; processing the digital image data from the at least one identified column using an extended differentiation filter; and using the output of the extended differentiation filter to identify a starting position or an ending position of the partial column defect.
    Type: Application
    Filed: September 14, 2001
    Publication date: March 20, 2003
    Applicant: Eastman Kodak Company
    Inventor: Timothy G. Wengender