Patents by Inventor Timothy J. Cornish

Timothy J. Cornish has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5464985
    Abstract: A reflectron capable of focusing an entire mass range of product ions at substantially the same focal point, comprising a plurality of lens plates, each having an opening therein, for generating a non-linear electric field in the reflectron. To generate the non-linear electric field, the voltage applied to each successive lens plate increases non-linearly with respect to its adjacent lens plate. The voltage of the first lens plate having the opening through which the ions first enter the reflectron is set to a low potential and the voltage being applied to each successive lens plate increases in a non-linear manner with the largest voltage being applied to the lens plate furthest from the first lens plate. This non-linear voltage application, to generate the non-linear electric field, can be achieved by coupling a potentiometer between each lens plate and adjusting each potentiometer accordingly.
    Type: Grant
    Filed: October 1, 1993
    Date of Patent: November 7, 1995
    Assignee: The Johns Hopkins University
    Inventors: Timothy J. Cornish, Robert J. Cotter
  • Patent number: 5202563
    Abstract: A tandem time-of-flight mass spectrometer comprises a grounded vacuum housing, two reflecting-type mass analyzers coupled via a collision chamber, and flight channels electrically floated with respect to the grounded vacuum housing. The first reflecting-type mass analyzer receives ionized molecules (ions). These ions pass through the flight channel of the first reflecting-type mass analyzer and are fragmented in the collision chamber. The fragmented ions pass through the flight channel of the second reflecting-type mass analyzer. Detectors disposed in the collision chamber and in the second reflecting-type mass analyzer detect the spectrum of the first reflecting-type mass analyzer and the spectra of the tandem time-of-flight mass analyzer, respectively.
    Type: Grant
    Filed: May 16, 1991
    Date of Patent: April 13, 1993
    Assignee: The Johns Hopkins University
    Inventors: Robert J. Cotter, Timothy J. Cornish