Abstract: An example test system has resources that are distributed for access by a device under test (DUT). The example test system includes a device interface board (DIB) having sites to connect to devices to test, and a tester having slots configured to hold test instruments. Each test instrument has resources that are distributed over a dimension of the DIB. The resources are distributed to enable the devices in the sites equal access to the resources.

Abstract: An example test system has resources that are distributed for access by a device under test (DUT). The example test system includes a device interface board (DIB) having sites to connect to devices to test, and a tester having slots configured to hold test instruments. Each test instrument has resources that are distributed over a dimension of the DIB. The resources are distributed to enable the devices in the sites equal access to the resources.

Abstract: An improved sleeve for insulating a tacking strip from materials applied to furniture products. The sleeve covers and encompasses the entire tacking strip with the exception of a central corridor through which tacks from the strip extend. The sleeve slides over the tacking strip and includes a flexible flange graduated in thickness on either side of a central corridor left open by the sleeve. The sleeve is installed around the tacking strip by a lateral displacement of the sleeve over the strip causing the graduated flanges to deform slightly upon contact with each tack along the central corridor. Due to the deforming properties of the flange, resistance on each tack is small enough that insertion of the sleeve over the tacking strip not hindered yet sufficient to prevent further lateral displacement of the sleeve once it is installed around the tacking strip.