Abstract: A method and apparatus are provided for a support interface for memory-mapped resources. A support processor sends a sequence of commands over and FSI interface to a memory-mapped support interface on a processor chip. The memory-mapped support interface updates memory, memory-mapped registers or memory-mapped resources. The interface uses fabric packet generation logic to generate a single command packet in a protocol for the coherency fabric which consists of an address, command and/or data. Fabric commands are converted to FSI protocol and forwarded to attached support chips to access the memory-mapped resource, and responses from the support chips are converted back to fabric response packets. Fabric snoop logic monitors the coherency fabric and decodes responses for packets previously sent by fabric packet generation logic. The fabric snoop logic updates status register and/or writes response data to a read data register. The system also reports any errors that are encountered.

Abstract: A circuit for measuring timing uncertainty in a clocked digital path and in particular, the number of logic stages completed in any clock cycle. A local clock buffer receives a global clock and provides a complementary pair of local clocks. A first local (launch) clock is an input to a delay line, e.g., 3 clock cycles worth of series connected inverters. Delay line taps (inverter outputs) are inputs to a register that is clocked by the complementary clock pair to capture progression of the launch clock through the delay line and identify any variation (e.g., from jitter, VDD noise) in that progression. Global clock skew and across chip gate length variation can be measured by cross coupling launch clocks from a pair of such clock buffers and selectively passing the local and remote launch clocks to the respective delay lines.

Abstract: A circuit for measuring timing uncertainty in a clocked digital path and in particular, the number of logic stages completed in any clock cycle. A local clock buffer receives a global clock and provides a complementary pair of local clocks. A first local (launch) clock is an input to a delay line, e.g., 3 clock cycles worth of series connected inverters. Delay line taps (inverter outputs) are inputs to a register that is clocked by the complementary clock pair to capture progression of the launch clock through the delay line and identify any variation (e.g., from jitter, VDD noise) in that progression. Global clock skew and across chip gate length variation can be measured by cross coupling launch clocks from a pair of such clock buffers and selectively passing the local and remote launch clocks to the respective delay lines.

Abstract: A circuit for measuring timing uncertainty in a clocked digital path and in particular, the number of logic stages completed in any clock cycle. A local clock buffer receives a global clock and provides a complementary pair of local clocks. A first local (launch) clock is an input to a delay line, e.g., 3 clock cycles worth of series connected inverters. Delay line taps (inverter outputs) are inputs to a register that is clocked by the complementary clock pair to capture progression of the launch clock through the delay line and identify any variation (e.g., from jitter, VDD noise) in that progression. Global clock skew and across chip gate length variation can be measured by cross coupling launch clocks from a pair of such clock buffers and selectively passing the local and remote launch clocks to the respective delay lines.

Abstract: A computer implemented method, testing system, computer usable program code, and apparatus are provided for measuring microprocessor susceptibility to internal noise A noise generator modulates a clock signal to generate noise on a targeted component within a microprocessor. A function generator executes microprocessor functions on a plurality of functional components within the microprocessor. A maximum execution frequency on the plurality of functional components is then measured and a set of frequency ranges where the functional components are susceptible to the generated noise is determined.

Abstract: A method, computer program product and system for testing stuck-at-faults. A first register may be loaded with a first value where the first value may be written into each entry in a memory array. A second register may be loaded with a second value. A third register may be loaded with either the second value or a third value. The second and third values are pre-selected to test selector circuits for stuck-at-faults with a pattern where the pattern includes a set of bits to be inputted to selector circuits and a set of bits to be stored in the memory cells. A value stored in the n-most significant bits in both the second and third registers may be predecoded to produce a predecode value. The predecode value may be compared with the value stored in the n-most significant bits in an entry in the memory array to determine a stuck-at-fault.

Abstract: A method, computer program product and system for testing stuck-at-faults. A first register may be loaded with a first value where the first value may be written into each entry in a memory array. A second register may be loaded with a second value. A third register may be loaded with either the second value or a third value. The second and third values are pre-selected to test selector circuits for stuck-at-faults with a pattern where the pattern includes a set of bits to be inputted to selector circuits and a set of bits to be stored in the memory cells. A value stored in the n-most significant bits in both the second and third registers may be predecoded to produce a predecode value. The predecode value may be compared with the value stored in the n-most significant bits in an entry in the memory array to determine a stuck-at-fault.

Abstract: A method and system for testing an integrated circuit (IC) comprising a plurality of logic units and a plurality of level sensitive scan design latches (LSSD) chains (scan chains) where the partitioning of the scan chains is different than the partitioning of the logic units. Scan blocks, each scan block comprising multiplexers, a pseudo random pattern generator (PRPG), a partitioned multiple input shift register (MISR), functional logic and control function logic are distributively placed around and close to scan inputs and scan outputs of the IC in otherwise unused area too small for larger functional logic blocks. The MISR, which contains many loaded latches and other logic, would normally be the largest element of the scan block has been partitioned into a sub-set of a full MISR to minimize the size of an individual scan block.

Abstract: A method and apparatus for scanning the test and diagnostics control logic on a chip maintains the state of the chip in a frozen state as the scan of the normally free-running logic occurs. The chip is configured to select the test and diagnostics control logic if an instruction to scan the test and free-running logic is in the instruction register. A scan switch is configured to pass the scan output from the free-running logic to the test data output on the chip. Test data input is passed to the test and diagnostics control logic through the use of the scan select, as with the other logic units. The control interface is configured to feed a stop control and scan control signal back to the free-running logic under control of stop enable and scan enable signals. Outputs are forced to an electrically safe value by shadowing the driver control register, which controls the functional output.

Abstract: A data processing system has at least one integrated circuit containing a central processing unit (CPU) that includes at least first and second processing cores. The integrated circuit also includes input facilities that receive control input specifying which of the processing cores is to be utilized. In addition, the integrated circuit includes configuration logic that decodes the control input and, in response, selectively controls reception of input signals and transmission of output signals of one or more of the processing cores in accordance with the control input. In an illustrative embodiment, the configuration logic is partial-good logic that configures the integrated circuit to utilize the second processing core, in lieu of a defective or inactive first processing core, as a virtual first processing core.

Abstract: A method and apparatus for pipelining clock control signals across a chip. The present invention avoids the need for multiple clock distribution systems by allowing clock controls for clock stopping, scanning, and debugging to be distributed to all local clock buffers through pipelined non-scan latches. The test control pipeline latches may be routed along with the clock through the clock receiver, the central clock buffer, and the sector buffer areas of the chip. A relatively low speed testing mechanism may be used to drive the testing of the chip externally. The test clock is synchronized with a free-running clock on the chip to allow the circuit to be operated at speed during the testing of the chip. During boundary scan, the pipelined controls are forced to static levels which are active levels for scanning. Non-pipelined signals control the boundary scan operation based directly on the TCK clock defined in the IEEE 1149.1 boundary scan standard.

Abstract: A method and apparatus for pipelining clock control signals across a chip. The present invention avoids the need for multiple clock distribution systems by allowing clock controls for clock stopping, scanning, and debugging to be distributed to all local clock buffers through pipelined non-scan latches. The test control pipeline latches may be routed along with the clock through the clock receiver, the central clock buffer, and the sector buffer areas of the chip. A relatively low speed testing mechanism may be used to drive the testing of the chip externally. The test clock control signals are synchronized with a free-running clock on the chip to allow the circuit to be operated at speed during the testing of the chip.

Abstract: A method of storing values in a cache used by a processor of a computer system, the cache having two or more cache directories. An address tag associated with the memory block is written into a first cache directory during an initial processor cycle, the address tag is written into a second cache directory during the next or subsequent processor cycle. Another address tag associated with a different memory block may be read from the second cache directory during the initial processor cycle. Additionally, another address tag associated with yet a different memory block may be read from the first cache directory during the subsequent processor cycle.

Abstract: A method of accessing values stored in a cache used by a processor of a computer system, whereby two read operations may occur simultaneously is disclosed. Memory blocks from a memory device are loaded into respective cache lines of the cache, and address tags associated with the memory blocks are written into two redundant cache directories of the cache. Thereafter, a first memory block can be read from the cache using the first cache directory, while a second memory block is simultaneously read from the cache using the second cache directory. The cache can have a single cache entry array, or two (redundant) cache entry arrays connected respectively to the two cache directories. If an error occurs when examining a particular address tag in one cache directory, then a redundant address tag can be substituted for the particular address tag by examining a corresponding line of the other cache directory.

Abstract: A method of dynamically avoiding defective cache lines in a cache used by a processor of a computer system is disclosed. A repair mask is used, having an array of bit fields each corresponding to a cache lines in the cache, and certain bit fields in the repair mask array are initially set to indicate that a group of corresponding cache lines are defective. Thereafter the repair mask is updated by setting additional bit fields in the repair mask array to indicate that an additional group of corresponding cache lines are defective. Access to all defective cache lines is prevented based on the corresponding bit fields in the repair mask array. The initial setting of certain bit fields can take place at fabrication of the cache chip in response to testing of the cache lines. Additionally, the repair mask may be updated each time the computer system is booted in response to testing by the boot procedure.

Abstract: A method of bypassing defects in a cache used by a processor of a computer system. A repair mask has an array of bit fields corresponding to cache lines in the cache, and when a particular cache line in the cache is identified as being defective, a corresponding bit field in the repair mask array is set to indicate that the particular cache line is defective, and further access to the defective cache line is prevented, based on the corresponding bit field in the repair mask array. The repair mask can be used to prevent the defective cache line from ever resulting in a cache hit, and to prevent the defective cache line from ever being chosen as a victim for cache replacement. Using a set associative cache, the defective cache line is thereby effectively removed from its respective congruence class. This approach allows the cache to use all non-defective cache lines without any cache lines being reserved for redundancy.

Abstract: A method of accessing a cache used by a processor of a computer system, to eliminate arbitration logic which would otherwise be required to handle operations from multiple snooping devices. A plurality of cache directories are provided in the cache, respectively connected directly to a plurality of snooping devices using a plurality of interconnects. An operation from a given snooping device is then handled by using a respective cache directory to issue a response to a respective interconnect. For example, a first cache directory may be connected to a first interconnect on a processor side of the cache, and a second cache directory may be connected to a second interconnect on a system bus side of the cache. This construction allows handling of operations from multiple snooping devices without having to use critical path arbitration logic. Furthermore, this construction allows for improved cache access due to the physical placement of the multiple cache directories.

Abstract: A method of correcting an erroneous bit field in a cache used by a processor is disclosed. A first array stores a plurality of bit fields, respectively connected to error checking circuits, and a substitute bit field is supplied for a bit field in the first array that is found to be erroneous by the error checking circuits, the substitute bit field being read from a second array which redundantly stores the bit fields. The error checking circuits can be connected to a parity error control unit which reads the substitute bit field from the second array. The parity error control unit forces the cache into a busy mode when any of the error checking circuits indicates that a bit field is erroneous, and maintains the busy mode until the substitute bit field is supplied.

Abstract: A method of determining if a requested memory block of a memory device is contained in a cache used by a processor of a computer system is disclosed. An address associated with the requested memory block is compared to a plurality of address tags stored in a cache directory of the cache, while simultaneously performing error checks on the address tags. Corrected address tags are supplied for any erroneous address tags indicated by the error checks, and any corrected address tags are also compared to the address of the requested memory block. The error check may be a parity check of a portion of the address tag, either the entire portion, or of several subsets having a number of bits smaller than the address tag. The address tags can be stored in a redundant cache directory of the cache, and the corrected address tags supplied by substituting corresponding address tags from the redundant cache directory.