Patents by Inventor Timothy Neal Ayres

Timothy Neal Ayres has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for minimizing ground bounce during DC parametric tests using boundary scan register
    Patent number: 6000050
    Abstract: The method of controlling ground bounce during DC parametric tests disclosed herein is based on the formulation of tests that best achieve two broad goals. The first goal is to reduce the number of I/O pins that are switched simultaneously. In the formulation of the VIL and VIH tests this goal is implemented by preferably only switching one input at a time. The second goal is to simultaneously switch I/O pins that are distant from one another. In the formulation of the VOL and VOH tests this goal is implemented by partitioning the outputs into subsets and selecting preferably one and only one output at a time from each and every subset.
    Type: Grant
    Filed: October 23, 1997
    Date of Patent: December 7, 1999
    Assignee: Synopsys, Inc.
    Inventors: Michio Komoda, Timothy Neal Ayres, Amitava Majumdar