Patents by Inventor Timothy Ray Keen

Timothy Ray Keen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for determining heterogeneous bottom friction distributions using a numerical wave model
    Patent number: 8000945
    Abstract: A computer-implemented inversion method for determining characteristics of a bottom roughness field using a numerical wave model is provided. Measured wave heights over an area of interest are compared to predicted wave heights calculated by a wave model using an estimated bottom roughness parameter. If the error between the measured wave heights and the predicted wave heights is within a specified tolerance level, the analysis ends and the value of the bottom roughness parameter used in the wave model is retrieved. If the error is not within the specified tolerance level, an Influence Matrix IM is used to obtain a revised estimated bottom roughness parameter. The wave model is re-run using the revised roughness parameter and the resulting predicted wave heights are compared to the measured wave heights. The inversion continues until the wave height error is within the specified tolerance level. When the inversion ends, the bottom roughness field that produced those predicted wave heights is retrieved.
    Type: Grant
    Filed: August 8, 2008
    Date of Patent: August 16, 2011
    Assignee: The United States of America represented by the Secretary of the Navy
    Inventors: William Erick Rogers, Timothy Ray Keen, Kenneth Todd Holland
  • Method for Determining Heterogeneous Bottom Friction Distributions using a Numerical Wave Model
    Publication number: 20100036650
    Abstract: A computer-implemented inversion method for determining characteristics of a bottom roughness field using a numerical wave model is provided. Measured wave heights over an area of interest are compared to predicted wave heights calculated by a wave model using an estimated bottom roughness parameter. If the error between the measured wave heights and the predicted wave heights is within a specified tolerance level, the analysis ends and the value of the bottom roughness parameter used in the wave model is retrieved. If the error is not within the specified tolerance level, an Influence Matrix IM is used to obtain a revised estimated bottom roughness parameter. The wave model is re-run using the revised roughness parameter and the resulting predicted wave heights are compared to the measured wave heights. The inversion continues until the wave height error is within the specified tolerance level. When the inversion ends, the bottom roughness field that produced those predicted wave heights is retrieved.
    Type: Application
    Filed: August 8, 2008
    Publication date: February 11, 2010
    Applicant: The Government of the United States as represented by the U.S.Navy
    Inventors: William Erick Rogers, Timothy Ray Keen, Kenneth Todd Holland