Abstract: A semiconductor structure comprises: a semiconductor substrate; one or more first implant layers disposed in the semiconductor substrate and forming a circuit portion and a first test portion, the circuit portion forming an at least partially formed semiconductor circuit; and one or more second implant layers disposed in the semiconductor substrate and further forming the circuit portion and a second test portion, wherein the first and second test portions are spaced apart. A first implantation profile of the one or more first implant layers of the first test portion is obtained during a testing procedure, and the first implantation profile is a representation of a second implantation profile of the one or more first implant layers of the circuit portion.

Abstract: A package assembly includes a substrate, an electronic component and a cover. The electronic component and the cover are disposed on the substrate, wherein the electronic component is located within a chamber between the cover and the substrate. A cooling liquid may be filled in a heat dissipation space of the cover, so as to dissipate the heat generated by the electronic component. Furthermore, the cooling liquid may be filled in the chamber where the electronic component is located, so as to directly dissipate the heat generated by the electronic component.

Abstract: An embodiment includes a method including forming an opening in a cut metal gate region of a metal gate structure of a semiconductor device, conformally depositing a first dielectric layer in the opening, conformally depositing a silicon layer over the first dielectric layer, performing an oxidation process on the silicon layer to form a first silicon oxide layer, filling the opening with a second silicon oxide layer, performing a chemical mechanical polishing on the second silicon oxide layer and the first dielectric layer to form a cut metal gate plug, the chemical mechanical polishing exposing the metal gate structure of the semiconductor device, and forming a first contact to a first portion of the metal gate structure and a second contact to a second portion of the metal gate structure, the first portion and the second portion of the metal gate structure being separated by the cut metal gate plug.

Abstract: In some embodiments, an image sensor is provided. The image sensor includes a photodetector disposed in a semiconductor substrate. A wave guide filter having a substantially planar upper surface is disposed over the photodetector. The wave guide filter includes a light filter disposed in a light filter grid structure. The light filter includes a first material that is translucent and has a first refractive index. The light filter grid structure includes a second material that is translucent and has a second refractive index less than the first refractive index.

Abstract: In some embodiments, an image sensor is provided. The image sensor includes a photodetector disposed in a semiconductor substrate. A wave guide filter having a substantially planar upper surface is disposed over the photodetector. The wave guide filter includes a light filter disposed in a light filter grid structure. The light filter includes a first material that is translucent and has a first refractive index. The light filter grid structure includes a second material that is translucent and has a second refractive index less than the first refractive index.

Abstract: In some embodiments, an image sensor is provided. The image sensor includes a photodetector disposed in a semiconductor substrate. A wave guide filter having a substantially planar upper surface is disposed over the photodetector. The wave guide filter includes a light filter disposed in a light filter grid structure. The light filter includes a first material that is translucent and has a first refractive index. The light filter grid structure includes a second material that is translucent and has a second refractive index less than the first refractive index.

Abstract: In some embodiments, an image sensor is provided. The image sensor includes a photodetector disposed in a semiconductor substrate. A wave guide filter having a substantially planar upper surface is disposed over the photodetector. The wave guide filter includes a light filter disposed in a light filter grid structure. The light filter includes a first material that is translucent and has a first refractive index. The light filter grid structure includes a second material that is translucent and has a second refractive index less than the first refractive index.

Abstract: In some embodiments, an image sensor is provided. The image sensor includes a photodetector disposed in a semiconductor substrate. A wave guide filter having a substantially planar upper surface is disposed over the photodetector. The wave guide filter includes a light filter disposed in a light filter grid structure. The light filter includes a first material that is translucent and has a first refractive index. The light filter grid structure includes a second material that is translucent and has a second refractive index less than the first refractive index.

Abstract: A latch-bolt mechanism includes a housing, a latch-bolt, and a drive member. The latch-bolt is movable between an extended position and a retracted position, and includes a bolt body and an engaging member operable to move relative to the bolt body between an engagement position and a disengagement position and having an engaging portion. The drive member has a driving portion. When the engaging member is at the engagement position, the driving portion can be activated to contact and push the engaging portion so as to move the latch-bolt from the extended position to the retracted position. When the engaging member is at the disengagement position, contact between the driving portion and the engaging portion can be prevented.

Abstract: A latch-bolt mechanism includes a housing, a latch-bolt, and a drive member. The latch-bolt is movable between an extended position and a retracted position, and includes a bolt body and an engaging member operable to move relative to the bolt body between an engagement position and a disengagement position and having an engaging portion. The drive member has a driving portion. When the engaging member is at the engagement position, the driving portion can be activated to contact and push the engaging portion so as to move the latch-bolt from the extended position to the retracted position. When the engaging member is at the disengagement position, contact between the driving portion and the engaging portion can be prevented.