Patents by Inventor Ting-Hao Hsu
Ting-Hao Hsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12270709Abstract: An infrared sensor uses an infrared lens with infrared filtering and focusing functions. Thus, an infrared filter can be omitted to reduce the costs and volume. In addition, a getter on the inside of a metal cover of the infrared sensor can be activated when the metal cover is soldered to the substrate of the infrared sensor. Therefore, the packaging process of the infrared sensor can be simplified.Type: GrantFiled: May 25, 2021Date of Patent: April 8, 2025Assignee: TXC CORPORATIONInventors: Tzong-Sheng Lee, Jen-Wei Luo, Chia-Hao Weng, Chun-Chi Lin, Ting-Chun Hsu, Hui-Jou Yu, Yi-Hung Lin, Sung-Hung Lin
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Publication number: 20250068561Abstract: A method for performing data access management of a memory device in predetermined communications architecture with aid of multi-table checking and associated apparatus are provided. The method may include: utilizing the memory controller to receive a first command from a host device, wherein the first command indicates that reading first data at a first logical address is requested; checking at least one logical-to-physical (L2P) address mapping table to generate a first checking result and starting performing a first read operation according to the first checking result, and checking a temporary physical-to-logical (P2L) address mapping table corresponding to a first active block to generate a second checking result for selectively performing a second read operation according to the second checking result; and returning the first data to the host device, wherein the first data is read according to one of the first checking result and the second checking result.Type: ApplicationFiled: August 22, 2023Publication date: February 27, 2025Applicant: Silicon Motion, Inc.Inventors: Jie-Hao Lee, Ting-Fong Hsu
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Patent number: 12205819Abstract: A semiconductor device includes a first transistor and a second transistor. The first transistor includes: a first source and a first drain separated by a first distance, a first semiconductor structure disposed between the first source and first drain, a first gate electrode disposed over the first semiconductor structure, and a first dielectric structure disposed over the first gate electrode. The first dielectric structure has a lower portion and an upper portion disposed over the lower portion and wider than the lower portion. The second transistor includes: a second source and a second drain separated by a second distance greater than the first distance, a second semiconductor structure disposed between the second source and second drain, a second gate electrode disposed over the second semiconductor structure, and a second dielectric structure disposed over the second gate electrode. The second dielectric structure and the first dielectric structure have different material compositions.Type: GrantFiled: December 5, 2022Date of Patent: January 21, 2025Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Huan-Chieh Su, Zhi-Chang Lin, Ting-Hung Hsu, Jia-Ni Yu, Wei-Hao Wu, Yu-Ming Lin, Chih-Hao Wang
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Publication number: 20240393673Abstract: A method of scanning a substrate and determining scratches of the substrate includes transmitting a converging beam of light that comprises multiple wavelengths to the substrate. Each wavelength of the multiple wavelengths focuses at a different distance in a focus interval around and including a surface of the substrate. The method also includes receiving reflected light from the surface of the substrate and determining a height or depth of the surface of the substrate based on a wavelength of the reflected light having a highest intensity.Type: ApplicationFiled: July 31, 2024Publication date: November 28, 2024Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chih-Cheng CHEN, ShinAn KU, Ting-Hao HSU, Hsin-Chang LEE
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Patent number: 12140857Abstract: A method of scanning a substrate and determining scratches of the substrate includes transmitting a converging beam of light that comprises multiple wavelengths to the substrate. Each wavelength of the multiple wavelengths focuses at a different distance in a focus interval around and including a surface of the substrate. The method also includes receiving reflected light from the surface of the substrate and determining a height or depth of the surface of the substrate based on a wavelength of the reflected light a highest intensity.Type: GrantFiled: July 24, 2023Date of Patent: November 12, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Chih-Cheng Chen, ShinAn Ku, Ting-Hao Hsu, Hsin-Chang Lee
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Publication number: 20240295826Abstract: A method of inspecting an outer surface of a mask pod includes moving a stage holding a mask pod such that the stage stops at each location of a plurality of locations under an outer surface of the mask pod for a predefined amount of time. At each location of the plurality of locations, the method further includes directing a stream of air to the outer surface of the mask pod, capturing an image of scattered air from each location of the plurality of locations of the outer surface of the mask pod, and determining a number of particles in the scattered air as a sampled number of particles based on the captured image. The method also includes generating a map of particles on the outer surface of the mask pod based on the sampled number of particles at each of the plurality of locations.Type: ApplicationFiled: May 14, 2024Publication date: September 5, 2024Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Shih-Jui HUANG, ShinAn KU, Ting-Hao HSU, Hsin-Chang LEE
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Patent number: 12013646Abstract: In a method of inspecting an outer surface of a mask pod, a stream of air is directed at a first location of a plurality of locations on the outer surface. One or more particles are removed by the directed stream of air from the first location on the outer surface. Scattered air from the first location of the outer surface is extracted and a number of particles in the extracted scattered air is determined as a sampled number of particles at the first location. The mask pod is moved and the stream of air is directed at other locations of the plurality of locations to determine the sampled number of particles in extracted scattered air at the other locations. A map of the particles on the outer surface of the mask pod is generated based on the sampled number of particles at the plurality of locations.Type: GrantFiled: March 27, 2023Date of Patent: June 18, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Shih-Jui Huang, ShinAn Ku, Ting-Hao Hsu, Hsin-Chang Lee
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Publication number: 20240053676Abstract: A method includes performing a lithography process using a mask and a pellicle membrane; detaching the pellicle membrane from the mask after the lithography process is completed; performing an inspection process to the pellicle membrane, the inspection process including generating a laser beam toward the pellicle membrane from a laser source, such that the laser beam passes through the pellicle membrane; and generating an image by receiving the laser beam passing through the pellicle membrane using an image sensor; and determining whether a particle is present on the pellicle membrane or a pin hole is present in the pellicle membrane based on the image.Type: ApplicationFiled: August 11, 2022Publication date: February 15, 2024Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Chia Hao CHANG, Pei-Cheng HSU, Chih-Cheng CHEN, Huan-Ling LEE, Ting-Hao HSU, Hsin-Chang LEE
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Patent number: 11855099Abstract: A method includes forming a first dielectric layer over the substrate and covering first, second, third, fourth, fifth and sixth protrusion regions; forming first, second, and third gate conductors over the first, fourth, and fifth protrusion regions, respectively; performing a first implantation process to form a second source region and a second drain region in the fourth protrusion region; performing a second implantation process to form a first source region and a first drain region in the first protrusion region, and to form a third source region and a third drain region in the fifth protrusion region; forming a metal layer over the third protrusion region; patterning the metal layer to form an inner circular electrode and an outer ring electrode encircling the inner circular electrode; forming a word line; and forming a bit line.Type: GrantFiled: January 24, 2022Date of Patent: December 26, 2023Assignees: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., NATIONAL TAIWAN UNIVERSITYInventors: Jenn-Gwo Hwu, Ting-Hao Hsu
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Publication number: 20230367192Abstract: A method of scanning a substrate and determining scratches of the substrate includes transmitting a converging beam of light that comprises multiple wavelengths to the substrate. Each wavelength of the multiple wavelengths focuses at a different distance in a focus interval around and including a surface of the substrate. The method also includes receiving reflected light from the surface of the substrate and determining a height or depth of the surface of the substrate based on a wavelength of the reflected light a highest intensity.Type: ApplicationFiled: July 24, 2023Publication date: November 16, 2023Inventors: Chih-Cheng CHEN, ShinAn KU, Ting-Hao HSU, Hsin-Chang LEE
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Patent number: 11768431Abstract: A method of scanning a substrate and determining scratches of the substrate includes transmitting a converging beam of light that comprises multiple wavelengths to the substrate. Each wavelength of the multiple wavelengths focuses at a different distance in a focus interval around and including a surface of the substrate. The method also includes receiving reflected light from the surface of the substrate and determining a height or depth of the surface of the substrate based on a wavelength of the reflected light having a highest intensity.Type: GrantFiled: November 10, 2020Date of Patent: September 26, 2023Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Chih-Cheng Chen, ShinAn Ku, Ting-Hao Hsu, Hsin-Chang Lee
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Publication number: 20230251581Abstract: In a method of inspecting an outer surface of a mask pod, a stream of air is directed at a first location of a plurality of locations on the outer surface. One or more particles are removed by the directed stream of air from the first location on the outer surface. Scattered air from the first location of the outer surface is extracted and a number of particles in the extracted scattered air is determined as a sampled number of particles at the first location. The mask pod is moved and the stream of air is directed at other locations of the plurality of locations to determine the sampled number of particles in extracted scattered air at the other locations. A map of the particles on the outer surface of the mask pod is generated based on the sampled number of particles at the plurality of locations.Type: ApplicationFiled: March 27, 2023Publication date: August 10, 2023Inventors: Shih-Jui HUANG, ShinAn KU, Ting-Hao HSU, Hsin-Chang LEE
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Patent number: 11722099Abstract: A device includes a substrate, a first electrode and a second electrode. The first electrode is disposed on the substrate, and configured to receive an input signal. The second electrode is disposed on the substrate, and configured to output an output signal based on the input signal. When the input signal is configured to oscillate within a first range between a first voltage value and a second voltage value with a first frequency, the output signal is an inverted version of the input signal, and has the first frequency. When the input signal is configured to oscillate within a second range including the first voltage value without the second voltage value with the first frequency, the output signal has a second frequency which is approximately twice of the first frequency.Type: GrantFiled: July 22, 2022Date of Patent: August 8, 2023Assignees: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD., NATIONAL TAIWAN UNIVERSITYInventors: Jenn-Gwo Hwu, Ting-Hao Hsu
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Publication number: 20230238384Abstract: A method includes forming a first dielectric layer over the substrate and covering first, second, third, fourth, fifth and sixth protrusion regions; forming first, second, and third gate conductors over the first, fourth, and fifth protrusion regions, respectively; performing a first implantation process to form a second source region and a second drain region in the fourth protrusion region; performing a second implantation process to form a first source region and a first drain region in the first protrusion region, and to form a third source region and a third drain region in the fifth protrusion region; forming a metal layer over the third protrusion region; patterning the metal layer to form an inner circular electrode and an outer ring electrode encircling the inner circular electrode; forming a word line; and forming a bit line.Type: ApplicationFiled: January 24, 2022Publication date: July 27, 2023Applicants: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., NATIONAL TAIWAN UNIVERSITYInventors: Jenn-Gwo HWU, Ting-Hao HSU
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Patent number: 11614691Abstract: In a method of inspecting an outer surface of a mask pod, a stream of air is directed at a first location of a plurality of locations on the outer surface. One or more particles are removed by the directed stream of air from the first location on the outer surface. Scattered air from the first location of the outer surface is extracted and a number of particles in the extracted scattered air is determined as a sampled number of particles at the first location. The mask pod is moved and the stream of air is directed at other locations of the plurality of locations to determine the sampled number of particles in extracted scattered air at the other locations. A map of the particles on the outer surface of the mask pod is generated based on the sampled number of particles at the plurality of locations.Type: GrantFiled: August 13, 2021Date of Patent: March 28, 2023Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Shih-Jui Huang, ShinAn Ku, Ting-Hao Hsu, Hsin-Chang Lee
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Patent number: 11591039Abstract: A bicycle head is configured to be mounted on a bicycle frame. The bicycle head includes a vertical tube, a stem, a handlebar, a first brake lever, and a shift control box. One end of the stem is mounted on the vertical tube. The handlebar is fixed to another end of the stem. The first brake lever assembly is mounted on the handlebar. The first brake lever assembly includes a main body, a brake assembly, a shift switch, and a battery. The brake assembly and the battery are disposed on the main body, and the shift switch is disposed on the brake assembly. The shift control box is disposed on one of the vertical tube, the stem, and the handlebar and electrically connected to the battery and the shift switch.Type: GrantFiled: September 7, 2021Date of Patent: February 28, 2023Assignee: TEKTRO TECHNOLOGY CORPORATIONInventors: Bo-Yi Liao, Chia-Hao Yang, Ting Hao Hsu
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Publication number: 20230049308Abstract: In a method of inspecting an outer surface of a mask pod, a stream of air is directed at a first location of a plurality of locations on the outer surface. One or more particles are removed by the directed stream of air from the first location on the outer surface. Scattered air from the first location of the outer surface is extracted and a number of particles in the extracted scattered air is determined as a sampled number of particles at the first location. The mask pod is moved and the stream of air is directed at other locations of the plurality of locations to determine the sampled number of particles in extracted scattered air at the other locations. A map of the particles on the outer surface of the mask pod is generated based on the sampled number of particles at the plurality of locations.Type: ApplicationFiled: August 13, 2021Publication date: February 16, 2023Inventors: Shih-Jui HUANG, ShinAn KU, Ting-Hao HSU, Hsin-Chang LEE
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Publication number: 20220360222Abstract: A device includes a substrate, a first electrode and a second electrode. The first electrode is disposed on the substrate, and configured to receive an input signal. The second electrode is disposed on the substrate, and configured to output an output signal based on the input signal. When the input signal is configured to oscillate within a first range between a first voltage value and a second voltage value with a first frequency, the output signal is an inverted version of the input signal, and has the first frequency. When the input signal is configured to oscillate within a second range including the first voltage value without the second voltage value with the first frequency, the output signal has a second frequency which is approximately twice of the first frequency.Type: ApplicationFiled: July 22, 2022Publication date: November 10, 2022Applicants: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD., NATIONAL TAIWAN UNIVERSITYInventors: Jenn-Gwo HWU, Ting-Hao HSU
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Patent number: 11411535Abstract: A device is disclosed that includes an insulating layer, a first electrode, a second electrode, and a bottom electrode. The insulating layer is disposed on a first surface of a substrate. The first electrode and the second electrode are disposed on a first surface of the insulating layer. The first electrode receives an input signal, and the second electrode outputs, in response to the input signal, an output signal. The bottom electrode is disposed on a second surface, opposite to the first surface, of the substrate and receives an operating voltage to modify a frequency of the output signal.Type: GrantFiled: March 18, 2021Date of Patent: August 9, 2022Assignees: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD., NATIONAL TAIWAN UNIVERSITYInventors: Jenn-Gwo Hwu, Ting-Hao Hsu
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Publication number: 20220081059Abstract: A bicycle head is configured to be mounted on a bicycle frame. The bicycle head includes a vertical tube, a stem, a handlebar, a first brake lever, and a shift control box. One end of the stem is mounted on the vertical tube. The handlebar is fixed to another end of the stem. The first brake lever assembly is mounted on the handlebar. The first brake lever assembly includes a main body, a brake assembly, a shift switch, and a battery. The brake assembly and the battery are disposed on the main body, and the shift switch is disposed on the brake assembly. The shift control box is disposed on one of the vertical tube, the stem, and the handlebar and electrically connected to the battery and the shift switch.Type: ApplicationFiled: September 7, 2021Publication date: March 17, 2022Applicant: TEKTRO TECHNOLOGY CORPORATIONInventors: Bo-Yi LIAO, Chia-Hao YANG, Ting Hao HSU