Abstract: A light emitting module includes a carrier, a light emitting element, a reflection layer, and a fluorescent layer. The light emitting element is disposed on the carrier. The reflection layer is disposed on the carrier and surrounds the light emitting element. The fluorescent layer covers at least part of the light emitting element. The disadvantages of over broad light emitting angle and low illuminance may be solved. Comparing with the related art, the present disclosure achieves an object of increasing the illuminance by at least 10%.

Abstract: A display may have an array of pixels. Display driver circuitry may supply data and control signals to the pixels. Each pixel may have seven transistors, a capacitor, and a light-emitting diode such as an organic light-emitting diode. The seven transistors may receive control signals using horizontal control lines. Each pixel may have first and second emission enable transistors that are coupled in series with a drive transistor and the light-emitting diode of that pixel. The first and second emission enable transistors may be coupled to a common control line or may be separately controlled so that on-bias stress can be effectively applied to the drive transistor. The display driver circuitry may have gate driver circuits that provide different gate line signals to different rows of pixels within the display. Different rows may also have different gate driver strengths and different supplemental gate line loading structures.

Abstract: A nozzle replaceable atomizer with automatic abnormality detecting function is provided. In the atomizer, when a detachable spray head is assembled to a main machine, a microcomputer serves to automatically set a piezoelectric element at an optimal operating frequency. When working at the optimal operating frequency that allows resonance, the piezoelectric element has the least impedance and the current/voltage phase difference of zero. During the operation of the atomizer, once the current/voltage phase-comparing circuit notices that the current/voltage phase difference is not zero or not close to zero, the microcomputer triggers a frequency-tracing prompter to inform a user that a frequency-tracing switch has to be operated to redefine the operating frequency of the piezoelectric element. If repeated adjustments have been done as failure and the frequency-tracing prompter keeps giving prompts, the user can be sure that the spray head needs to be maintained or replaced.

Abstract: A nozzle replaceable atomizer with automatic abnormality detecting function is provided. In the atomizer, when a detachable spray head is assembled to a main machine, a microcomputer serves to automatically set a piezoelectric element at an optimal operating frequency. When working at the optimal operating frequency that allows resonance, the piezoelectric element has the least impedance and the current/voltage phase difference of zero. During the operation of the atomizer, once the current/voltage phase-comparing circuit notices that the current/voltage phase difference is not zero or not close to zero, the microcomputer triggers a frequency-tracing prompter to inform a user that a frequency-tracing switch has to be operated to redefine the operating frequency of the piezoelectric element. If repeated adjustments have been done as failure and the frequency-tracing prompter keeps giving prompts, the user can be sure that the spray head needs to be maintained or replaced.

Abstract: A method for controlling and managing a smart atomizer involves automatically frequency tracing to rapidly optimize an operating frequency of a piezoelectric element of a spray nozzle when the spray nozzle is assembled to a main machine of the smart atomizer. The main machine performs spray-dosage setting, so that each spray session can operate according a preset spray dosage, so as to provide consistent spray of liquid easily. While the liquid is sprayed, the frequency-abnormality detecting means keeps detecting whether there is any abnormality of the operating frequency of the piezoelectric element. Thereby, whether the spray nozzle works normally can be easily confirmed by whether a frequency-tracing prompter gives out a prompt and what maintenance message is contained in the prompt. The method also includes event recording and external record reading for storing, exporting and leveraging data about usage of the atomizer for improved usage of the atomizer.

Abstract: The present invention discloses an auto-assembling system for small shell devices. The system includes a first transportation apparatus, a second transportation apparatus, a first driving module, a second driving module, a power assembling module and a control circuit. The first transportation apparatus having a first transportation belt and the second transportation apparatus having a second transportation belt are used to transport the frames or the covers of the devices. The power assembling module mounted on the end of the first transportation apparatus and the second transportation apparatus is used for vertically pressing downwardly the frames and the covers such that the frames and the covers can be assembled.

Abstract: The present invention proposes a smart automatic recording system and method for monitoring wafer fragmentation, which system comprises a plurality of photographing devices, a multiple-image transmitter, a multiple-image receiver, and a PC. The photographing devices are used to monitor the circumstances when wafers are polished. The photographed images are then transferred to the multiple-image receiver by the multiple-image transmitter. After the multiple-image receiver receives the image signals, it merges the images captured at the same time into the same image frame. Next, the multiple-image receiver transfers the image signal to the input terminal of an image-capturing card in the PC. The PC also receives the wafer-entry and wafer-exit signals and the signal of wafer fragmentation transferred from the port of the polishing apparatus. The present invention can be exploited to facilitate judgement, diagnosis, genuine factor verification, or engineering improvement and management for associated technicians.

Abstract: A polishing assistant system applied to a polished wafer polished by a chemical mechanical polishing (CMP) is disclosed. The polishing assistant system includes a monitoring device for detecting a first polishing parameter of the polished wafer, and a polishing assistant apparatus. The polishing assistant apparatus further includes a platen for placing the polished wafer, a liquid supplier for supplying a slurry, a polishing controller for receiving the first polishing parameter and outputting a first control signal which is relative to a certain region of the polished wafer in response to the first polishing parameter, and a polish head electrically connected to the polishing controller and polishing the certain region of the polished wafer in response to the first control signal.

Abstract: A flexible assembling partition system includes a plurality of octagonal block units assembled with one another, at least a sheathing frame member for covering all side extensions formed on each block unit, and a plurality of face members each face member embedded in each block unit serving as a finishing, decorative illuminative surface for each block unit, thereby forming a partition structure easily optionally assembled or disassembled.