Patents by Inventor Ting-Chung Wang
Ting-Chung Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11944970Abstract: A microfluidic detection unit comprises at least one fluid injection section, a fluid storage section and a detection section. Each fluid injection section defines a fluid outlet; the fluid storage section is in gas communication with the atmosphere and defines a fluid inlet; the detection section defines a first end in communication with the fluid outlet and a second end in communication with the fluid inlet. A height difference is defined between the fluid outlet and the fluid inlet along the direction of gravity. When a first fluid is injected from the at least one fluid injection section, the first fluid is driven by gravity to pass through the detection section and accumulate to form a droplet at the fluid inlet, such that a state of fluid pressure equilibrium of the first fluid is established.Type: GrantFiled: June 10, 2019Date of Patent: April 2, 2024Assignees: INSTANT NANOBIOSENSORS, INC., INSTANT NANOBIOSENSORS CO., LTD.Inventors: Yu-Chung Huang, Yi-Li Sun, Ting-Chou Chang, Jhy-Wen Wu, Nan-Kuang Yao, Lai-Kwan Chau, Shau-Chun Wang, Ying Ting Chen
-
Publication number: 20220301922Abstract: A device includes a substrate, a first fin, a second fin, a first isolation structure, a second isolation structure, and a gate structure. The first fin extends from a p-type region of the substrate. The second fin extends from an n-type region of the substrate. The first isolation structure is over the p-type region and adjacent to the first fin. The first isolation structure has a bottom surface and opposite first and second sidewalls connected to the bottom surface, a first round corner is between the bottom surface and the first sidewall of the first isolation structure, and the first sidewall is substantially parallel to the second sidewall. The second isolation structure is over the n-type region and adjacent to the first fin. The first isolation structure is deeper than the second isolation structure. The gate structure is over the first isolation structure and covering the first fin.Type: ApplicationFiled: July 9, 2021Publication date: September 22, 2022Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Hsien-Chung HUANG, Chiung-Wen HSU, Mei-Ju KUO, Yu-Ting WENG, Yu-Chi LIN, Ting-Chung WANG, Chao-Cheng CHEN
-
Publication number: 20120239220Abstract: In a method for controlling the temperature inside an environmental chamber using an electronic device, a target temperature T0, and a current internal temperature T and a current humidity level RH inside the environmental chamber are acquired. A current dew point Td of air inside the environmental chamber is calculated using a dew point calculation formula requiring the current internal temperature T and the current humidity level RH. The surface temperature of an object under test which is placed in the environmental chamber is detected using a temperature sensor. The environmental chamber is controlled according to the target temperature T0, the current internal temperature T, the current humidity level RH, and the surface temperature of the object under test.Type: ApplicationFiled: June 10, 2011Publication date: September 20, 2012Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: TING-CHUNG WANG
-
Patent number: 8166346Abstract: A power-on test system is used to test a number of blades of a blade server. The power-on test system supplies power to the number of blades. The power-on test system times for the blades after supplying power, and determines whether the blades are powered on after supplying power. If one of the blades is not powered on, the power-on test system determining whether an accumulated time is less than a set power-on time. If the accumulated time is equal to or greater than a power-on setting time, the power-on test system sends internet protocol address of the blade being not powered on to be displayed.Type: GrantFiled: March 16, 2010Date of Patent: April 24, 2012Assignee: Hon-Hai Precision Industry Co., Ltd.Inventor: Ting-Chung Wang
-
Publication number: 20110138233Abstract: A power-on test system is used to test a number of blades of a blade server. The power-on test system supplies power to the number of blades. The power-on test system times for the blades after supplying power, and determines whether the blades are powered on after supplying power. If one of the blades is not powered on, the power-on test system determining whether an accumulated time is less than a set power-on time. If the accumulated time is equal to or greater than a power-on setting time, the power-on test system sends internet protocol address of the blade being not powered on to be displayed.Type: ApplicationFiled: March 16, 2010Publication date: June 9, 2011Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: TING-CHUNG WANG
-
Patent number: 7928720Abstract: A system measures power conversion efficiency of a voltage regulator. A measurement setting module presets a maximum output current and a total measurement number, and calculates each target output current of the voltage regulator. A load adjustment module adjusts an impedance of the electronic load to equal current passing through the electronic load to the target output current of the voltage regulator. A calculation module calculates each output power and input power, and power conversion efficiencies for each sequence number of measurement.Type: GrantFiled: September 14, 2009Date of Patent: April 19, 2011Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Ting-Chung Wang
-
Publication number: 20110031958Abstract: A system measures power conversion efficiency of a voltage regulator. A measurement setting module presets a maximum output current and a total measurement number, and calculates each target output current of the voltage regulator. A load adjustment module adjusts an impedance of the electronic load to equal current passing through the electronic load to the target output current of the voltage regulator. A calculation module calculates each output power and input power, and power conversion efficiencies for each sequence number of measurement.Type: ApplicationFiled: September 14, 2009Publication date: February 10, 2011Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: TING-CHUNG WANG
-
Publication number: 20100313057Abstract: A clock signal test apparatus for testing a computer system includes a frequency generator to generate a clock pulse signal, a real-time clock (RTC) chip to receive the clock pulse signal from the frequency generator, and a micro control unit (MCU). The MCU is to receive a test command signal from the computer system to set a first current time of the RTC chip equal to a current system time of the computer system, and to receive a time comparing command from the computer system after a test interval to retrieve a second current time of the RTC chip and transmit the second current time of the RTC chip to the computer system.Type: ApplicationFiled: June 30, 2009Publication date: December 9, 2010Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: TING-CHUNG WANG
-
Publication number: 20100306592Abstract: A computer system on/off test apparatus includes a time control unit receiving a time interval value and a repetition value, a detecting unit detecting signal parameters of the computer system, and a test control unit receiving an external power supply and switching the power connection between the external power supply and the computer system. The test control unit saves a number of acceptable ranges. The test control unit receives a power-on status signal returned from the computer system in response to the computer system is powered. The test control unit determines whether the power-on status signal is correct and the detected signal parameters of the computer system are within the acceptable ranges correspondingly. The test control unit turns off the computer system after the interval time, and then turns on the computer system to repeat the above process until the test number of tests reaches the repetition value.Type: ApplicationFiled: July 6, 2009Publication date: December 2, 2010Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: Ting-Chung Wang