Patents by Inventor Tjerk OOSTERKAMP

Tjerk OOSTERKAMP has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Magnetic resonance force detection apparatus and associated methods
    Patent number: 10746824
    Abstract: A magnetic resonance force detection apparatus, comprising: a sample carrier for carrying a sample to be tested; a magnetic field source configured to provide a magnetic field to a sample when it is carried by the sample carrier; a support for supporting either the sample carrier or the magnetic field source; a support-driving-mechanism configured to drive the support such that the sample carrier moves relative to the magnetic field source, such that the magnetic field is configured to cause the spins of one or more nuclei or electrons in the sample to flip, and wherein the flipping of spins exerts a force on the support; and a support-displacement-measuring-sensor configured to measure displacement of the support and generate a signal representative of the displacement of the support.
    Type: Grant
    Filed: March 1, 2017
    Date of Patent: August 18, 2020
    Assignee: UNIVERSITEIT LEIDEN
    Inventors: Arthur den Haan, Jelmer Wagenaar, Tjerk Oosterkamp, Rembrandt Donkersloot
  • A MAGNETIC RESONANCE FORCE DETECTION APPARATUS AND ASSOCIATED METHODS
    Publication number: 20190072623
    Abstract: A magnetic resonance force detection apparatus, comprising: a sample carrier for carrying a sample to be tested; a magnetic field source configured to provide a magnetic field to a sample when it is carried by the sample carrier; a support for supporting either the sample carrier or the magnetic field source; a support-driving-mechanism configured to drive the support such that the sample carrier moves relative to the magnetic field source, such that the magnetic field is configured to cause the spins of one or more nuclei or electrons in the sample to flip, and wherein the flipping of spins exerts a force on the support; and a support-displacement-measuring-sensor configured to measure displacement of the support and generate a signal representative of the displacement of the support.
    Type: Application
    Filed: March 1, 2017
    Publication date: March 7, 2019
    Inventors: Arthur den HAAN, Jelmer WAGENAARU, Tjerk OOSTERKAMP, Rembrandt DONKERSLOOT