Patents by Inventor To Sho

To Sho has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Shape measuring apparatus and shape measuring method
    Patent number: 8334985
    Abstract: A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape bei
    Type: Grant
    Filed: October 8, 2010
    Date of Patent: December 18, 2012
    Assignee: OMRON Corporation
    Inventors: To Sho, Takashi Sakai, Daisuke Mitsumoto, Yasuhiro Ohnishi, Takeshi Kojima, Yasumoto Mori, Shree Nayar
  • SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD
    Publication number: 20120086950
    Abstract: A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape bei
    Type: Application
    Filed: October 8, 2010
    Publication date: April 12, 2012
    Applicant: OMRON CORPORATION
    Inventors: To Sho, Takashi Sakai, Daisuke Mitsumoto, Yasuhiro Ohnishi, Takeshi Kojima, Yasumoto Mori, Shree Nayar