Abstract: A device and method for measuring wafers include an optical coherence tomograph and a scanning device that scans the surface of a wafer successively at a plurality of measuring points. Two measuring points have a distance dmax of 140 mm?dmax?600 mm. An evaluation unit calculates distance values and/or thickness values from the interference signals provided by the optical coherence tomograph.

Abstract: A device for measuring wafers includes an optical coherence tomograph and a scanning device that scans the surface of the wafer successively at a plurality of measuring points. Two measuring points have a distance dmax of 140 mm?dmax?600 mm. An evaluation unit calculates distance values and/or thickness values from the interference signals provided by the optical coherence tomograph.

Abstract: A device for measuring wafers includes an optical coherence tomograph, which generates a measuring light beam and directs it onto the wafer via an optical system. A scanning device deflects the measuring light beam in two spatial directions. A control unit controls the scanning device so that the measuring light beam scans the surface of the wafer successively at several measuring points. Two measuring points have a distance dmax of 140 mm?dmax?600 mm. An evaluation unit calculates distance values and/or thickness values from the interference signals provided by the optical coherence tomograph and, based on the distance values and/or thickness values, at least one characteristic quantity of the wafer such as TTV, warp or bow.

Abstract: An optical thickness measuring device includes a light source, a measuring head, an optical spectrometer with an optical component for spectrally splitting an input light, a detector, and an evaluation device. The light source is optically connected to the measuring head and is configured to generate an at least low-coherence measuring light and to direct it to the measuring head. The measuring head is optically connected to the spectrometer and is configured to direct the measuring light onto a measuring object and to direct light reflected therefrom, which originates from two different surfaces, onto a measuring object, which originates from two different surfaces, and to direct the reflected light to the spectrometer as input light.

Abstract: A device for measuring wafers includes an optical coherence tomograph and a scanning device that scans the surface of the wafer successively at a plurality of measuring points. Two measuring points have a distance dmax of 140 mm?dmax?600 mm. An evaluation unit calculates distance values and/or thickness values from the interference signals provided by the optical coherence tomograph.

Abstract: The invention relates to a device for detecting a voltage drop between an anode connection and a cathode connection, comprising: a control capacitor, of which the first electrode is connected to the anode connection and the second electrode is connected to the cathode connection; a measuring device, which is designed to output a discharge signal depending on a potential difference detected between the anode connection and the cathode connection and a first threshold value for the potential difference on a discharge control line; a discharge circuit which is connected to the discharge control line and is designed to discharge the control capacitor depending on the discharge signal; and a control device, which is designed to detect the voltage drop by evaluating the state of charge of the control capacitor.

Abstract: The invention relates to a restart protection device (1) for a battery-powered electric hand tool (2), comprising—a control capacitor (CCTRL) having a cathode and an anode, wherein the cathode can be connected to an earth connection (10) of the electric hand tool (2) and the anode can be connected via a battery pack interface (4) of the electric hand tool (2) to a connector wire (6) of a battery pack (3) of the electric hand tool (2); —a controllable discharge circuit (14) designed for discharging the control capacitor (CCTRL), wherein a control input of the discharge circuit (14) can be connected via the battery pack interface (4) to a signal line (9) of the battery pack (3); —a measuring device (15) designed to determine a charge state of the control capacitor (CCTRL); and—a control device (13) connected to the measuring device (15), which control device is configured to inhibit start-up of the electric hand tool (2) if the charge state of the control capacitor (CCTRL) determined by means of the measuring d

Abstract: An arrangement for measuring a single cell in a rechargeable battery pack is described, and which includes a plurality of cells coupled in a series circuit, and wherein adjacent cells are electrically coupled to a connecting branch, and a measuring device comprising a switch is provided, and which selectively electrically connects one connecting branch to a measuring input of the measuring device.

Abstract: An arrangement for measuring a single cell in a rechargeable battery pack is described, and which includes a plurality of cells coupled in a series circuit, and wherein adjacent cells are electrically coupled to a connecting branch, and a measuring device comprising a switch is provided, and which selectively electrically connects one connecting branch to a measuring input of the measuring device.

Abstract: A method for checking the buildability of a virtual prototype includes an automatic ascertainment of possible problem points that may arise in the course of assembling the virtual prototype from virtual components and do not satisfy predetermined structural, physical and/or aesthetic requirements. The method includes an assessment, assisted by a computer system, of at least one of the possible problem points as a critical or uncritical problem point, depending on several structural, physical and/or aesthetic features of the respective possible problem point. Furthermore, an apparatus is proposed for checking the buildability of a virtual prototype. With methods and apparatuses according to exemplary embodiments, the effort in terms labour and time and also faulty assessments are capable of being reduced by an automatic assessment of problem points and by a more efficient assessment of problem points.

Abstract: A light-based method of endovascular treatment, in particular, of pathologically altered blood vessels. Provided are a Method of Endovascular Light Treatment and a corresponding Endovascular Light Application Device.

Abstract: A light-based method of endovascular treatment, in particular, of pathologically altered blood vessels. Provided are a Method of Endovascular Light Treatment and a corresponding Endovascular Light Application Device.

Abstract: A light-based method of endovascular treatment, in particular, of pathologically altered blood vessels. Provided are a Method of Endovascular Light Treatment and a corresponding Endovascular Light Application Device.

Abstract: An arrangement for measuring a single cell in a rechargeable battery pack is described, and which includes a plurality of cells coupled in a series circuit, and wherein adjacent cells are electrically coupled to a connecting branch, and a measuring device comprising a switch is provided, and which selectively electrically connects one connecting branch to a measuring input of the measuring device.

Abstract: A light-based method of endovascular treatment, in particular, of pathologically altered blood vessels. Provided are a Method of Endovascular Light Treatment and a corresponding Endovascular Light Application Device.