Abstract: A system for confocal-chromatic line distance measurement, comprising a line light source (2), an aperture (3), a confocal-chromatic, preferably rotationally symmetrical, measurement lens (6), and a spectrometer (14), preferably a 2D spectrometer, wherein the illumination beam path extends from the light source (2) via the aperture (3) and a first region (5) of the measurement lens (6) to the measurement object (9) and wherein the imaging beam path extends from the measurement object (6) via a second region (11) of the measurement lens (6) to the spectrometer (14). Furthermore, a method for confocal-chromatic line distance measurement is specified.

Abstract: A spectrometer with a lens, a dispersive element, and a detector, wherein a measuring light guided onto the lens is projected by way of the lens onto the dispersive element, is reflected back to the lens by the dispersive element in a spectrally dispersed manner, and is guided onto the detector by way of the lens, is designed and developed with regard to high performance given a compact structural size with structurally simple means such that the lens is a single lens or individual lens having at least one non-spherical surface for influencing the imaging. Furthermore, a corresponding distance measurement system and a corresponding method for operating a spectrometer are specified.

Abstract: The invention relates to a spectrometer comprising a combination of at least one grid (1) and at least one prism (2), characterized in that total reflexion is used to produce a compact spectrometer in at least one prism (2).

Abstract: The invention relates to a spectrometer comprising a combination of at least one grid (1) and at least one prism (2), characterised in that total reflexion is used to produce a compact spectrometer in at least one prism (2).

Abstract: The invention relates to a device (1) for non-contacting measuring of a distance and/or a profile of a measured object (9), a light source (2) generating an illuminating light beam for illuminating the measured object (9), and a detector (11) being provided for detecting the reflected portion of the illuminating light beam at the measured object (9), characterized with regard to a potentially robust and nevertheless compact sensor construction in that a first optic (13) and a second optic are disposed in the beam path of the illuminating light beam, wherein the illuminating light beam can first be expanded in an expansion plane parallel to the diffusion direction by means of the first optic (13), and then made nearly parallel by means of the second optic. In a particularly preferable embodiment, the second optic is formed by a Fresnel lens (5). A corresponding method is disclosed.

Abstract: An optical sensor for measuring at least one of a range, a position, and a profile of an object that is to be measured, the measured object emitting electromagnetic radiation due to the temperature of the object to be measured, and the sensor having a light source for illuminating the surface of the measured object and a detector for detecting the illuminating light reflected at the object to be measured, wherein with respect to the measurability even on the bodies that emit electromagnetic radiation, the light generated by the light source has a wavelength below the peak of the Planck radiation spectrum of the object that is to be measured. A corresponding method is specified.

Abstract: An optical sensor for measuring at least one of a range, a position, and a profile of an object that is to be measured, the measured object emitting electromagnetic radiation due to the temperature of the object to be measured, and the sensor having a light source for illuminating the surface of the measured object and a detector for detecting the illuminating light reflected at the object to be measured, wherein with respect to the measurability even on the bodies that emit electromagnetic radiation, the light generated by the light source has a wavelength below the peak of the Planck radiation spectrum of the object that is to be measured. A corresponding method is specified.

Abstract: The invention relates to a device (1) for non-contacting measuring of a distance and/or a profile of a measured object (9), a light source (2) generating an illuminating light beam for illuminating the measured object (9), and a detector (11) being provided for detecting the reflected portion of the illuminating light beam at the measured object (9), characterized with regard to a potentially robust and nevertheless compact sensor construction in that a first optic (13) and a second optic are disposed in the beam path of the illuminating light beam, wherein the illuminating light beam can first be expanded in an expansion plane parallel to the diffusion direction by means of the first optic (13), and then made nearly parallel by means of the second optic. In a particularly preferable embodiment, the second optic is formed by a Fresnel lens (5). A corresponding method is disclosed.

Abstract: The invention relates to a method for producing temperature-stable large-size emitting LEDs and LEDs produced by said method. The method is characterised in that a large-area emitting light emitter is provided in the form of semiconductor nanocrystals which furthermore is temperature-stable and has a narrow band emission. A colloidal solution of emitting nanocrystals and a matrix of either inorganic gels or at least one polymer are alternately applied to the substrate with the first electrode by spraying, as a result of the electrostatic interactions between substrate, nanoparticles and inorganic gels or polymers, the nanopartides or the polymers of the matrix are adsorbed and the impurities run down with the solvent. The layer of alternately sprayed nanocrystals and matrix are heated to give a gel cross-linking the metal oxide nanoparticles, wherein thee size of thee semiconductor nanocrystals which determine the emission wavelength are determined by the temperature and duration of the heating.