Patents by Inventor Todd Christopher Wilson
Todd Christopher Wilson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11816258Abstract: A head-mounted display system is disclosed herein. The head-mounted display system includes an input device, the input device configured to output an input signal based upon an input response by a user; a head-mounted visual display device having an output screen, the head-mounted visual display device configured to display one or more screen images on the output screen; and at least one data processing device operatively coupled to the input device and the head-mounted visual display device. The at least one data processing device is programmed to generate and display at least one displaceable visual object and visual target on the output screen of the head-mounted visual display device; receive an input signal from the input device based upon an input response by the user; and control the movement of the displaceable visual object towards the visual target based upon the input signal received from the input device.Type: GrantFiled: October 13, 2022Date of Patent: November 14, 2023Assignee: Bertec CorporationInventors: Necip Berme, Murat Kerim Berme, Fernando Vanderlinde dos Santos, Todd Christopher Wilson
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Patent number: 11158422Abstract: A measurement and testing system is disclosed herein. The measurement and testing system includes a first measurement device and a second measurement device and a data processing device operatively coupled to the first measurement device and the second measurement device. In one or more embodiments, the data processing device is configured to synchronize each of a first plurality of data values from the first measurement device with each of a second plurality of data values from the second measurement device by determining which first timestamps associated with the first plurality of data values correspond to second timestamps associated with the second plurality of data values. In one or more other embodiments, the data processing device is configured to compute time-delayed values of one or more first measurement signals from a first measurement device using a predetermined time delay.Type: GrantFiled: October 12, 2020Date of Patent: October 26, 2021Assignee: Bertec CorporationInventors: Todd Christopher Wilson, Necip Berme, Jan Jakub Ober
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Patent number: 10803990Abstract: A measurement and testing system is disclosed herein. The measurement and testing system includes a first measurement device and a second measurement device and a data processing device operatively coupled to the first measurement device and the second measurement device. In one or more embodiments, the data processing device is configured to synchronize each of a first plurality of data values from the first measurement device with each of a second plurality of data values from the second measurement device by determining which first timestamps associated with the first plurality of data values correspond to second timestamps associated with the second plurality of data values. In one or more other embodiments, the data processing device is configured to compute time-delayed values of one or more first measurement signals from a first measurement device using a predetermined time delay.Type: GrantFiled: June 24, 2019Date of Patent: October 13, 2020Assignee: Bertec CorporationInventors: Todd Christopher Wilson, Necip Berme, Jan Jakub Ober
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Patent number: 10331324Abstract: A measurement and testing system is disclosed herein. The measurement and testing system includes a plurality of force measurement assemblies; an input device configured to output a signal comprising input data indicative of which of the plurality of force measurement assemblies are to be combined with one another; and a data processing device operatively coupled to the input device and each of the force transducers of each of the force measurement assemblies, the data processing device is configured to receive the signal outputted by the input device and to form a virtual force measurement assembly comprising a subset of the plurality of force measurement assemblies based upon the input data of the signal. In one or more embodiments, the data processing device further is configured to combine a plurality of measurement signals with varying sampling rates into a single time-synced synthetic channel.Type: GrantFiled: November 25, 2017Date of Patent: June 25, 2019Assignee: Bertec CorporationInventors: Todd Christopher Wilson, Necip Berme
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Patent number: 9829311Abstract: A force measurement system that includes at least one force plate module is disclosed herein. The at least one force plate module has a plurality of force plate assemblies supported on a base component, each of the force plate assemblies includes a plate component having a top surface, the top surface of the plate component forming a force measurement surface for receiving at least one portion of a body of a subject; and at least one force transducer, the at least one force transducer configured to sense one or more measured quantities and output one or more signals that are representative of the one or more measured quantities, the plate component being supported on the at least one force transducer. The at least one force plate module is configured to be connected to one or more additional force plate modules so as to form a modular array of force plates.Type: GrantFiled: November 30, 2015Date of Patent: November 28, 2017Assignee: Bertec CorporationInventors: Todd Christopher Wilson, Necip Berme, Jan Jakub Ober
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Patent number: 9200897Abstract: A measurement and testing system comprising a plurality of measurement assemblies and a data acquisition and processing device is disclosed. Each of the plurality of measurement assemblies includes a measurement surface for receiving at least one portion of a body of a subject; and at least one measurement device configured to sense one or more measured quantities and output one or more signals that are representative of the one or more measured quantities. In one embodiment, the data acquisition and processing device is configured to determine whether a load is being applied to a particular one of the plurality of measurement assemblies by a first or second body portion of the subject. In another embodiment, the data acquisition and processing device is configured to construct a first virtual measurement assembly from a first subset of measurement assemblies and a second virtual measurement assembly from a second subset of measurement assemblies.Type: GrantFiled: December 1, 2014Date of Patent: December 1, 2015Assignee: Bertec CorporationInventors: Todd Christopher Wilson, Necip Berme
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Patent number: 9043278Abstract: A system and method for merging a first database with a second database (one-way merge), and a system and method for merging two databases with one another (two-way merge) is described herein. During the one-way merge, new or updated records are transferred from a copy of a client database to a server database after it is determined that the server database either does not contain one or more records in the copy of the client database or contains an older version of one or more records in the copy of the client database. During the two-way merge, new or updated records are transferred between a client database and a server database after it is determined that either the client database or the server database does not contain one or more records in the other database or contains an older version of one or more records in the other database.Type: GrantFiled: April 14, 2014Date of Patent: May 26, 2015Assignee: Bertec CorporationInventors: Todd Christopher Wilson, Necip Berme
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Patent number: 8902249Abstract: A measurement and testing system includes a measurement assembly having at least one measurement device, at least one visual display device, and a data acquisition and processing device operatively coupled to the at least one measurement device of the measurement assembly and the visual display device. In one embodiment, the data acquisition and processing device is configured to generate one or more global reports utilizing the output of the measurement assembly, generate an information icon on the output screen of the visual display device, and assign the one or more global reports to the information icon. In other embodiments, the data acquisition and processing device is configured to automatically regulate the availability of tests based upon a requisite measurement assembly or a predetermined condition, and/or determine whether the output data from a plurality of measurement assemblies is to be combined so as to create a single virtual measurement assembly.Type: GrantFiled: September 30, 2013Date of Patent: December 2, 2014Assignee: Bertec CorporationInventors: Todd Christopher Wilson, Necip Berme
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Patent number: 8700569Abstract: A system and method for merging a first database with a second database (one-way merge), and a system and method for merging two databases with one another (two-way merge) is described herein. During the one-way merge, new or updated records are transferred from a copy of a client database to a server database after it is determined that the server database either does not contain one or more records in the copy of the client database or contains an older version of one or more records in the copy of the client database. During the two-way merge, new or updated records are transferred between a client database and a server database after it is determined that either the client database or the server database does not contain one or more records in the other database or contains an older version of one or more records in the other database.Type: GrantFiled: February 23, 2013Date of Patent: April 15, 2014Assignee: Bertec CorporationInventors: Todd Christopher Wilson, Necip Berme
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Patent number: 8643669Abstract: A measurement and testing system includes a measurement assembly having at least one measurement device, at least one visual display device, and a data acquisition and processing device operatively coupled to the at least one measurement device of the measurement assembly and the visual display device. In one embodiment, the data acquisition and processing device is further configured to generate a timeline bar with date icons on the output screen of the visual display device. In other embodiments, the data acquisition and processing device is further configured to automatically displace a side bar menu on the output screen when a user switches from a current mode to another mode, read external files containing one or more testing routines written off-site, and/or automatically alert a system user when one or more signals from a measurement device are no longer detected and/or are corrupted.Type: GrantFiled: December 22, 2012Date of Patent: February 4, 2014Assignee: Bertec CorporationInventors: Todd Christopher Wilson, Necip Berme
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Patent number: 8543540Abstract: A system and method for merging a first database with a second database (one-way merge), and a system and method for merging two databases with one another (two-way merge) is described herein. During the one-way merge, new or updated records are transferred from a copy of a client database to a server database after it is determined that the server database either does not contain one or more records in the copy of the client database or contains an older version of one or more records in the copy of the client database. During the two-way merge, new or updated records are transferred between a client database and a server database after it is determined that either the client database or the server database does not contain one or more records in the other database or contains an older version of one or more records in the other database.Type: GrantFiled: May 9, 2012Date of Patent: September 24, 2013Assignee: Bertec CorporationInventors: Todd Christopher Wilson, Necip Berme