Patents by Inventor Todd Day

Todd Day has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10107832
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Grant
    Filed: June 26, 2017
    Date of Patent: October 23, 2018
    Assignee: Oxford Instruments PLC
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
  • Publication number: 20170292971
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Application
    Filed: June 26, 2017
    Publication date: October 12, 2017
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
  • Patent number: 9689890
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Grant
    Filed: January 6, 2015
    Date of Patent: June 27, 2017
    Assignees: Oxford Instruments PLC, Oxford Instruments AFM, Inc
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
  • Publication number: 20150113687
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Application
    Filed: January 6, 2015
    Publication date: April 23, 2015
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
  • Patent number: 8925376
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Grant
    Filed: June 26, 2012
    Date of Patent: January 6, 2015
    Assignees: Oxford Instruments PLC, Oxford Instruments AFM, Inc
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
  • Publication number: 20120266336
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Application
    Filed: June 26, 2012
    Publication date: October 18, 2012
    Applicant: ASYLUM RESEARCH CORPORATION
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
  • Patent number: 8205488
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: June 26, 2012
    Assignee: Asylum Research Corporation
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
  • Patent number: 7937991
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Grant
    Filed: June 26, 2007
    Date of Patent: May 10, 2011
    Assignee: Asylum Research Corporation
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
  • Publication number: 20100333240
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Application
    Filed: June 29, 2010
    Publication date: December 30, 2010
    Applicant: Asylum Research Corporation
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
  • Publication number: 20080011067
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Application
    Filed: June 26, 2007
    Publication date: January 17, 2008
    Applicant: ASYLUM RESEARCH CORPORATION
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
  • Patent number: 7266997
    Abstract: An apparatus for simulating a tactile interface with the relative position of the probe of a cantilever-based force measurement instrument, such as an atomic force microscope, molecular force probe or profilometer, or the force between the probe and a sample. The device can be easily incorporated into existing control electronics for such instruments or can be incorporated into a relatively small and simple hand-held device to be used with such instruments.
    Type: Grant
    Filed: February 11, 2003
    Date of Patent: September 11, 2007
    Assignee: Asylum Research Corporation
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day
  • Patent number: 7234342
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Grant
    Filed: December 18, 2003
    Date of Patent: June 26, 2007
    Assignee: Asylum Research Corporation
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
  • Publication number: 20040206166
    Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
    Type: Application
    Filed: December 18, 2003
    Publication date: October 21, 2004
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
  • Publication number: 20040000189
    Abstract: An apparatus for simulating a tactile interface with the relative position of the probe of a cantilever-based force measurement instrument, such as an atomic force microscope, molecular force probe or profilometer, or the force between the probe and a sample. The device can be easily incorporated into existing control electronics for such instruments or can be incorporated into a relatively small and simple hand-held device to be used with such instruments.
    Type: Application
    Filed: February 11, 2003
    Publication date: January 1, 2004
    Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day