Patents by Inventor Todd Dunford

Todd Dunford has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250216360
    Abstract: An eddy current sensor with a remote current sense has a drive conductor, current sense conductor, and one or more sense conductors. The drive conductor has first and second loop portions, the current sense conductor has a third loop portion, and the sense conductor has a sense loop portion. The first and third loop portions are proximal to each other to form the remote current sense. The sense loop portion and the second loop portion are proximal to each other to form a sense element. The remote current sense and sense element are suitably distant from one another to have separate environments of sensitivity. The sensor may be used by collecting transimpedance measurements from both the remote current sense and sense element under known conditions, and with the sense element under unknown conditions. These measurements are combined to provide a calibrated measurement result suitable for further analysis.
    Type: Application
    Filed: March 28, 2023
    Publication date: July 3, 2025
    Applicant: JENTEK Sensors, Inc.
    Inventors: Todd Dunford, Andrew Washabaugh
  • Publication number: 20250044257
    Abstract: A system and method are provided for inspecting challenging material locations such as holes. The system may include a sensor cartridge (“mandrel”) for hole inspection that has a helical portion to which a sensor array is attached. The radius of the helical portion can be increased or decreased by applying a torque to the helical portion thereby allowing the sensor to be inserted into a hole or pressed against the wall of the hole. A scanner is described to which mandrels can be quickly connected and changed enabling an inspector to quickly switch between different mandrels (e.g., for different holes sizes and sensor configurations). Also disclosed is an inspection procedure and data processing algorithm for performing an inspection. The data processing algorithm utilizes a signature library for enhancing the detection or sizing of features of interest such as cracks. The algorithm and library can account for material edges, various material types.
    Type: Application
    Filed: August 13, 2024
    Publication date: February 6, 2025
    Applicant: JENTEK Sensors, Inc.
    Inventors: Todd Dunford, Neil Goldfine, Stuart Chaplan
  • Patent number: 12061169
    Abstract: A system and method are provided for inspecting challenging material locations such as holes. The system may include a sensor cartridge (“mandrel”) for hole inspection that has a helical portion to which a sensor array is attached. The radius of the helical portion can be increased or decreased by applying a torque to the helical portion thereby allowing the sensor to be inserted into a hole or pressed against the wall of the hole. A scanner is described to which mandrels can be quickly connected and changed enabling an inspector to quickly switch between different mandrels (e.g., for different holes sizes and sensor configurations). Also disclosed is an inspection procedure and data processing algorithm for performing an inspection. The data processing algorithm utilizes a signature library for enhancing the detection or sizing of features of interest such as cracks. The algorithm and library can account for material edges, various material types.
    Type: Grant
    Filed: April 27, 2022
    Date of Patent: August 13, 2024
    Assignee: JENTEK Sensors, Inc.
    Inventors: Todd Dunford, Neil Goldfine, Stuart Chaplan
  • Publication number: 20220341876
    Abstract: A system and method are provided for inspecting challenging material locations such as holes. The system may include a sensor cartridge (“mandrel”) for hole inspection that has a helical portion to which a sensor array is attached. The radius of the helical portion can be increased or decreased by applying a torque to the helical portion thereby allowing the sensor to be inserted into a hole or pressed against the wall of the hole. A scanner is described to which mandrels can be quickly connected and changed enabling an inspector to quickly switch between different mandrels (e.g., for different holes sizes and sensor configurations). Also disclosed is an inspection procedure and data processing algorithm for performing an inspection. The data processing algorithm utilizes a signature library for enhancing the detection or sizing of features of interest such as cracks. The algorithm and library can account for material edges, various material types.
    Type: Application
    Filed: April 27, 2022
    Publication date: October 27, 2022
    Applicant: JENTEK Sensors, Inc.
    Inventors: Todd Dunford, Neil Goldfine, Stuart Chaplan
  • Publication number: 20070272042
    Abstract: A set of curved components, such as the dovetail region of engine blades, are inspected by mounting each component into a circular carousel in a vertical orientation and rotating the carousel to move each component toward and away from an inspection site. The inspection site clamps a flexible eddy current sensor array to the curved material surface, scans the array over the surface, records the sensor position. A rigid element having a surface geometry similar to the surface shape of the component can be attached to the component to facilitate scanning of the sensor array over a component edge. The response of each sense element in the array may be converted into an effective material property and sense element proximity to the component material surface to verify the quality of the inspection scan and the presence of a defect such as a crack.
    Type: Application
    Filed: March 7, 2007
    Publication date: November 29, 2007
    Inventors: Neil Goldfine, Mark Windoloski, Vladimir Tsukernik, Darrell Schlicker, Todd Dunford, Andrew Washabaugh