Abstract: A circuit for reducing switching losses in a synchronous rectifier of a switching stage including a high-side control transistor and a low-side synchronous transistor coupled at a switching node, the switching stage receiving an input voltage and providing a controlled output voltage at an output node. The circuit including a first circuit portion for sensing waveshape edges of a first signal at a gate terminal of the low-side synchronous transistor and a first voltage to determine a delay between the waveshape edge of the first signal and the waveshape edge of the first voltage; and a second circuit portion for calibrating the first signal and the first voltage to align the waveshape edge of the first signal and the waveshape edge of the first voltage, with an optional offset to achieve minimal power loss.

Abstract: A circuit for reducing switching losses in a synchronous rectifier of a switching stage including a high-side control transistor and a low-side synchronous transistor coupled at a switching node, the switching stage receiving an input voltage and providing a controlled output voltage at an output node. The circuit including a first circuit portion for sensing waveshape edges of a first signal at a gate terminal of the low-side synchronous transistor and a first voltage to determine a delay between the waveshape edge of the first signal and the waveshape edge of the first voltage; and a second circuit portion for calibrating the first signal and the first voltage to align the waveshape edge of the first signal and the waveshape edge of the first voltage, with an optional offset to achieve minimal power loss.

Abstract: A method of obtaining an optimized dead time for a synchronous switching power supply comprising a control IC and two series-connected switches, comprising packaging the control IC and the series-connected switches in a co-packaged module; providing a dead time delay circuit within the control IC circuit which has variable dead time; testing the switching power supply; varying the dead time in a defined sequence during the step of testing; monitoring a parameter during testing of the switching power supply as the dead time is varied; determining an optimal dead time based upon monitoring the parameter; and setting the dead time at the optimal dead time.