Patents by Inventor Todd Wayne Karry

Todd Wayne Karry has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7484143
    Abstract: A system and method is disclosed for testing integrated circuits that contain memory devices. A plurality of test circuits is created in which each test circuit incorporates a physical fault in a memory bit cell. Each of the test circuits generates a distinct electrical signature that is due to presence of the physical fault in the test circuit. The electrical signatures from the test circuits are compared with a signal from an integrated circuit memory device to determine whether any of the physical faults in the test circuits are present in the integrated circuit memory device.
    Type: Grant
    Filed: May 7, 2007
    Date of Patent: January 27, 2009
    Assignee: National Semiconductor Corporation
    Inventors: Lee James Jacobson, Todd Wayne Karry
  • Patent number: 7216270
    Abstract: A system and method is disclosed for testing integrated circuits that contain memory devices. A plurality of test circuits is created in which each test circuit incorporates a physical fault in a memory bit cell. Each of the test circuits generates a distinct electrical signature that is due to presence of the physical fault in the test circuit. The electrical signatures from the test circuits are compared with a signal from an integrated circuit memory device to determine whether any of the physical faults in the test circuits are present in the integrated circuit memory device.
    Type: Grant
    Filed: May 14, 2004
    Date of Patent: May 8, 2007
    Assignee: National Semiconductor Corporation
    Inventors: Lee James Jacobson, Todd Wayne Karry