Abstract: An automated microtester, for simultaneously testing a plurality of devices under test, includes a processing system including a plurality of processor assemblies. A plurality of test sites are configured to releasably engage a plurality of devices under test. An instrumentation system is controllable by the processing system and is configured to provide one or more input signals to the plurality of test sites and read one or more monitored signals from the plurality of test sites.

Abstract: An automated microtester array, for simultaneously testing a plurality of devices under test, includes a plurality of automated microtesters, wherein each of the plurality of automated microtesters is configured to test a plurality of devices under test. A central computing system is configured to automate the testing of the plurality of devices under test coupled to the plurality of automated microtesters. A method and computer program product for instructing a plurality of automated microtesters to load an automated test process; and instructing the plurality of automated microtesters in execute the automated test process.

Abstract: A segmented subsystem, for use within an automated test platform, includes a first subsystem segment configured to execute one or more instructions within the first subsystem segment. A second subsystem segment is configured to execute one or more instructions within the second subsystem segment. The first subsystem segment includes: a first functionality, a second functionality, and a status polling engine. The status polling engine is configured to: determine a first status for the first functionality and a second status for the second functionality, and generate a consolidated status indicator for the first subsystem segment based, at least in part, upon the first status for the first functionality and the second status for the second functionality.

Abstract: A method, computer program product, and computing system for defining a first group of transient values for a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform. A monitoring subsystem is electrically coupled to the first group of conductive paths. A first group of signals present on the first group of conductive paths is monitored while executing at least a portion of an automated test process on the automated test platform to determine if any of the first group of signals exceeds any of the first group of transient values.

Abstract: A debugging system for debugging an automated test process used on an automated test platform. The debugging system includes a debugging coupler configured to be releasably electrically coupleable to a test head of the automated test platform. A debugging subsystem is electrically coupled to the debugging coupler and includes a signal generator configured to apply one or more signals to one or more conductive paths within the debugging coupler.

Abstract: A method, computer program product, and computing system for electrically coupling a monitoring subsystem to a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform. One or more signals present on the first group of conductive paths are monitored while executing at least a portion of an automated test process on the automated test platform. The monitoring subsystem is electrically coupled to a second group of conductive paths within the debugging coupler. One or more signals present on the second group of conductive paths are monitored while executing the at least a portion of the automated test process on the automated test platform.

Abstract: A method, computer program product, and computing system for monitoring a first group of signals present on a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform while executing at least a portion of an automated test process on the automated test platform. A second group of signals present on a second group of conductive paths is monitored while executing the at least a portion of the automated test process on the automated test platform. The first group of signals and the second group of signals are temporally aligned, thus defining a group of temporally aligned signals.

Abstract: A debugging system for debugging an automated test process used on an automated test platform. The debugging system includes a debugging subsystem and a debugging coupler electrically coupled to the debugging subsystem. The debugging coupler is configured to be releasably electrically coupleable to a test head of the automated test platform.

Abstract: A segmented subsystem, for use within an automated test platform, includes a first subsystem segment configured to execute one or more instructions within the first subsystem segment. A second subsystem segment is configured to execute one or more instructions within the second subsystem segment. The first subsystem segment includes: a first functionality, a second functionality, and a status polling engine. The status polling engine is configured to: determine a first status for the first functionality and a second status for the second functionality, and generate a consolidated status indicator for the first subsystem segment based, at least in part, upon the first status for the first functionality and the second status for the second functionality.