Patents by Inventor Tohishiko Nakata

Tohishiko Nakata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7092348
    Abstract: A method for recording information on a rewritable recording medium includes recording synchronizing signal information in a synchronizing signal portion on the medium, recording data information in a data portion of the medium after the synchronizing signal portion by forming marks in the data portion, and substantially randomly inverting the marks and spaces between the marks each time the information is recorded. The marks for particular areas of the medium are different in a physical property from other areas of the medium and data information is recorded in association with both ends of each of the marks. Upon rewriting of at least the recorded synchronizing signal information, a length of the synchronizing signal portion changes and a start position of the synchronizing signal portion changes, and wherein a change of the synchronizing signal information start position is smaller than a change of the length of the synchronizing signal portion.
    Type: Grant
    Filed: July 8, 2005
    Date of Patent: August 15, 2006
    Assignee: Hitachi, Ltd.
    Inventors: Hideaki Sasazawa, Tohishiko Nakata, Masahiro Watanabe, Shunichi Matsumoto
  • Patent number: 7084990
    Abstract: In size measurement of a semiconductor device, profiles of a pattern formed in a resist process are determined through an exposure/development simulation in respect of individual different combinations of exposure values and focus values to form a profile matrix and scattered light intensity distributions corresponding to the individual profiles are determined through calculation to form a scattered light library, thereby forming a profile library consisting of the profile matrix and scattered light library. A scattered light intensity distribution of an actually measured pattern is compared with the scattered light intensity distributions of the scattered light library and a profile of profile matrix corresponding to a scattered light intensity distribution of scattered light library having the highest coincidence is determined as a three-dimensional shape of the actually measured pattern.
    Type: Grant
    Filed: February 25, 2003
    Date of Patent: August 1, 2006
    Assignee: Hitachi, Ltd.
    Inventors: Hideaki Sasazawa, Tohishiko Nakata, Masahiro Watanabe, Shunichi Matsumoto
  • Patent number: 7075884
    Abstract: A method for recording information on a rewritable recording medium includes recording first synchronizing signal information in a first synchronizing signal portion on the rewritable recording medium, recording second synchronizing signal information in a second synchronizing signal portion following the first synchronizing signal portion on the rewritable recording medium, recording data information in a data portion of the rewritable recording medium after the second synchronizing signal portion by forming marks in the data portion. The data information corresponds to both ends of each the marks. The marks and spaces between the marks are substantially randomly inverted each time the information is recorded and a length of the first synchronizing signal portion changes and a start position of the first synchronizing signal portion changes. A change of the start position of the first synchronizing signal portion is smaller than a change of the length of the first synchronizing signal portion.
    Type: Grant
    Filed: July 8, 2005
    Date of Patent: July 11, 2006
    Assignee: Hitachi, Ltd.
    Inventors: Hideaki Sasazawa, Tohishiko Nakata, Masahiro Watanabe, Shunichi Matsumoto
  • Publication number: 20050243683
    Abstract: A method for recording information on a rewritable recording medium includes recording first synchronizing signal information in a first synchronizing signal portion on the rewritable recording medium, recording second synchronizing signal information in a second synchronizing signal portion following the first synchronizing signal portion on the rewritable recording medium, recording data information in a data portion of the rewritable recording medium after the second synchronizing signal portion by forming marks in the data portion. The data information corresponds to both ends of each the marks. The marks and spaces between the marks are substantially randomly inverted each time the information is recorded and a length of the first synchronizing signal portion changes and a start position of the first synchronizing signal portion changes. A change of the start position of the first synchronizing signal portion is smaller than a change of the length of the first synchronizing signal portion.
    Type: Application
    Filed: July 8, 2005
    Publication date: November 3, 2005
    Inventors: Hideaki Sasazawa, Tohishiko Nakata, Masahiro Watanabe, Shunichi Matsumoto
  • Publication number: 20050243684
    Abstract: A method for recording information on a rewritable recording medium includes recording synchronizing signal information in a synchronizing signal portion on the medium, recording data information in a data portion of the medium after the synchronizing signal portion by forming marks in the data portion, and substantially randomly inverting the marks and spaces between the marks each time the information is recorded. The marks for particular areas of the medium are different in a physical property from other areas of the medium and data information is recorded in association with both ends of each of the marks. Upon rewriting of at least the recorded synchronizing signal information, a length of the synchronizing signal portion changes and a start position of the synchronizing signal portion changes, and wherein a change of the synchronizing signal information start position is smaller than a change of the length of the synchronizing signal portion.
    Type: Application
    Filed: July 8, 2005
    Publication date: November 3, 2005
    Inventors: Hideaki Sasazawa, Tohishiko Nakata, Masahiro Watanabe, Shunichi Matsumoto
  • Publication number: 20030223087
    Abstract: In size measurement of a semiconductor device, profiles of a pattern formed in a resist process are determined through an exposure/development simulation in respect of individual different combinations of exposure values and focus values to form a profile matrix and scattered light intensity distributions corresponding to the individual profiles are determined through calculation to form a scattered light library, thereby forming a profile library consisting of the profile matrix and scattered light library. A scattered light intensity distribution of an actually measured pattern is compared with the scattered light intensity distributions of the scattered light library and a profile of profile matrix corresponding to a scattered light intensity distribution of scattered light library having the highest coincidence is determined as a three-dimensional shape of the actually measured pattern.
    Type: Application
    Filed: February 25, 2003
    Publication date: December 4, 2003
    Inventors: Hideaki Sasazawa, Tohishiko Nakata, Masahiro Watanabe, Shunichi Matsumoto