Patents by Inventor Tohru KINUGAWA

Tohru KINUGAWA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8772708
    Abstract: An embodiment with a dual-stage reflectron is as follows: (1) On the assumption that a reflector has a base potential XA(U) created by uniform electric fields, its design parameters are adjusted so as to cancel the first and second order derivatives at energy E=E0 of a total time of flight T(E), and a second-order focusing position on a central axis at which the potential value becomes zero is determined (Mamyrin solution). (2) A correcting potential XC(U) to be superposed on XA(U), beginning from the second-order focusing position, is calculated so that T(E) of ions reflected in a region deeper than the second-order focusing position will be constant. (3) Voltage values of the reflector electrodes are determined so that a real potential XR(U)=XA(U)+XC(U) is created on the central axis.
    Type: Grant
    Filed: December 20, 2011
    Date of Patent: July 8, 2014
    Assignees: National University Corporation Kobe University, Shimadzu Corporation
    Inventors: Tohru Kinugawa, Osamu Furuhashi
  • Publication number: 20140054456
    Abstract: An embodiment with a dual-stage reflectron is as follows: (1) On the assumption that a reflector has a base potential XA(U) created by uniform electric fields, its design parameters are adjusted so as to cancel the first and second order derivatives at energy E=E0 of a total time of flight T(E), and a second-order focusing position on a central axis at which the potential value becomes zero is determined (Mamyrin solution). (2) A correcting potential XC(U) to be superposed on XA(U), beginning from the second-order focusing position, is calculated so that T(E) of ions reflected in a region deeper than the second-order focusing position will be constant. (3) Voltage values of the reflector electrodes are determined so that a real potential XR(U)=XA(U)+XC(U) is created on the central axis.
    Type: Application
    Filed: December 20, 2011
    Publication date: February 27, 2014
    Inventors: Tohru Kinugawa, Osamu Furuhashi
  • Patent number: 8612162
    Abstract: A method creates an accurate mass spectrum with a high resolving power based on a plurality of TOF spectra, while reducing the computation to assure real-time processing. TOF spectra are measured when ions are ejected from the loop orbit. Then a coincidence detection method determines what mass-to-charge ratio a peak appearing on the TOF spectra originates from. The time range in which a corresponding peak appears on other TOF spectra is set, and the existence of the peak in that range is determined. When the corresponding peak is found on other TOF spectra, the m/z is deduced from the peak on the TOF spectrum with the highest resolving power and a mass spectrum is created. From the peak density around the peak of interest, the reliability of the deduction is computed. For a low reliability peak, the ion ejection time is optimized and the TOF spectrum is measured again.
    Type: Grant
    Filed: March 14, 2011
    Date of Patent: December 17, 2013
    Assignee: Shimadzu Corporation
    Inventors: Osamu Furuhashi, Kiyoshi Ogawa, Shigeki Kajihara, Tohru Kinugawa
  • Patent number: 8492711
    Abstract: A multi-turn time-of-flight mass spectrometer creates, an accurate mass spectrum of a wide mass range, with the smallest number of measurements. Deflecting electrodes are provided on an ejection path through which ions deviating from a loop orbit fly to a detector having two-dimensional array elements. A varying voltage applied to the deflecting electrodes creates an electric field. When two ions having different mass-to-charge ratios simultaneously arrive at the detector, these ions are affected with differing strengths since they pass through the deflecting electric field at different times. This results in arrival for the ions on a detection surface. The time an ion passing through the deflecting electric field can be calculated from the displacement of the arrival position of that ion. Then the flight speed of the ion is obtained and its number of turns is roughly deduced to arrive at its mass-to-charge ratio.
    Type: Grant
    Filed: November 4, 2011
    Date of Patent: July 23, 2013
    Assignee: Shimadzu Corporation
    Inventors: Tohru Kinugawa, Osamu Furuhashi
  • Publication number: 20120112060
    Abstract: A multi-turn time-of-flight mass spectrometer creates, an accurate mass spectrum of a wide mass range, with the smallest number of measurements. Deflecting electrodes are provided on an ejection path through which ions deviating from a loop orbit fly to a detector having a two-dimensional array elements. A varying voltage applied to the deflecting electrodes creates an electric field. When two ions having different mass-to-charge ratios simultaneously arrive at the detector, these ions are affected with differing strengths since they pass through the deflecting electric field at different times. This results in arrival for the ions on a detection surface. The time an ion passing through the deflecting electric field can be calculated from the displacement of the arrival position of that ion. Then the flight speed of the ion is obtained and its number of turns is roughly deduced to arrive at its mass-to-charge ratio.
    Type: Application
    Filed: November 4, 2011
    Publication date: May 10, 2012
    Applicant: SHIMADZU CORPORATION
    Inventors: Tohru KINUGAWA, Osamu FURUHASHI
  • Publication number: 20110231109
    Abstract: The present invention aims at creating an accurate mass spectrum with a high resolving power based on a plurality of multi-turn time-of-flight (TOF) spectra, while reducing the amount of computation to assure the real-time processing. First, a plurality of TOF spectra each obtained for a different timing when ions are ejected from the loop orbit are measured (S2 and S3). At this point, the concept of the coincidence detection method is utilized to determine what mass-to-charge ratio a peak appearing on the TOF spectra originates from. From the information on the peak of interest in one TOF spectrum and other data, the time range in which a corresponding peak appears on other TOF spectra is set, and the existence or nonexistence of the peak in that range is determined (S5). In the case where the corresponding peak is found on most of the other TOF spectra, the m/z is deduced from the peak on the TOF spectrum with the highest resolving power and a mass spectrum is created (S6 and S7).
    Type: Application
    Filed: March 14, 2011
    Publication date: September 22, 2011
    Applicants: SHIMADZU CORPORATION, KOBE UNIVERSITY
    Inventors: Osamu FURUHASHI, Kiyoshi OGAWA, Shigeki KAJIHARA, Tohru KINUGAWA