Patents by Inventor Tohru Miyata

Tohru Miyata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6698291
    Abstract: An ultrasonic inspection apparatus obtains information on the interface of a sample as digital waveform data for any “unit measurement range” and is provided with at least two data memories and controlled by a scan state monitoring signal showing the scan state of a unit measurement range belonging to a first group or a unit measurement range belonging to a second group. A comparator-register/memory-control-circuit outputs the scan state monitoring signal to the two data memories. The operating states of the two data memories being controlled by the scan state monitoring signal to alternate between writing of digital waveform data and readout of digital waveform data.
    Type: Grant
    Filed: March 7, 2003
    Date of Patent: March 2, 2004
    Assignee: Hitachi Kenki FineTech. Co., Ltd.
    Inventors: Noboru Yamamoto, Ken Takeuchi, Naoya Kawakami, Toshiyuki Hebaru, Makoto Ishijima, Tohru Miyata
  • Publication number: 20030167849
    Abstract: An ultrasonic inspection apparatus obtaining information on the interface of a sample as digital waveform data for any “unit measurement range” provided with at least two data memories and controlled by a scan state monitoring signal showing the scan state of a unit measurement range belonging to a first group or a unit measurement range belonging to a second group and a comparator-register/memory-control-circuit outputting the scan state monitoring signal to the at least two data memories, the operating states of the two data memories being controlled by the scan state monitoring signal to alternate between writing of digital waveform data and readout of digital waveform data, whereby digital type ultrasonic inspection and a high speed data transfer not having an effect on the data sampling at the time of scanning in a specific direction in any scan are realized, the dead time at the time of scanner scanning by transfer of a large volume of data is reduced to zero, and high speed planar scanning
    Type: Application
    Filed: March 7, 2003
    Publication date: September 11, 2003
    Inventors: Noboru Yamamoto, Ken Takeuchi, Naoya Kawakami, Toshiyuki Hebaru, Makoto Ishijima, Tohru Miyata
  • Patent number: 6112593
    Abstract: A non-destructive inspection device has an inspection unit body and a support casing which is used as a set-up type device by combining the inspection unit body and the support casing in ordinary inspection, and is used as a portable type device by separating them for special inspection situations involving narrow places or high places. The support casing can be freely combined to or separated from the inspection unit body. When combining the two components, the non-destructive inspection device can carry out the inspection based on a stable set-up mode in the same way as conventional devices. When separated, the inspection unit body is used as a portable device.
    Type: Grant
    Filed: November 10, 1998
    Date of Patent: September 5, 2000
    Assignee: Hitachi Construction Machinery Co., Ltd.
    Inventors: Shigenori Aoki, Tohru Miyata, Seigo Kikuchi, Shigeru Miwa, Hajime Mizunoya, Takenori Hiroki
  • Patent number: 5481917
    Abstract: A scanning range of an object under examination is divided into m pieces (m is an integer equal to or more than 2) in a subscanning direction. One measurement condition or one parameter is set in m steps, and an ultrasonic measurement is performed on the object under examination while allotting successively the m-stepped measurement conditions or the m-stepped parameters to the respective scanning regions divided in the subscanning direction. A plurality of measurement images obtained under the m-stepped measurement conditions are displayed so as to permit comparison on a screen, and one of the m-stepped measurement conditions or m-stepped parameters which corresponds to an image selected from the displayed screen is set as the measurement condition.
    Type: Grant
    Filed: August 24, 1994
    Date of Patent: January 9, 1996
    Assignee: Hitachi Construction Machinery Co., Ltd.
    Inventors: Yukio Arima, Toshihiro Kimura, Tohru Miyata, Yuichi Kunitomo
  • Patent number: D349464
    Type: Grant
    Filed: April 28, 1993
    Date of Patent: August 9, 1994
    Assignee: Hitachi Construction Machinery Co., Ltd.
    Inventors: Hiroaki Nakashima, Toshiyuki Utsuki, Toshihiko Wada, Yukio Arima, Tohru Miyata
  • Patent number: D350294
    Type: Grant
    Filed: April 28, 1993
    Date of Patent: September 6, 1994
    Assignee: Hitachi Construction Machinery Co., Ltd.
    Inventors: Hiroaki Nakashima, Toshiyuki Utsuki, Toshihiko Wada, Yukio Arima, Tohru Miyata