Patents by Inventor Tokuzo Nakaoki

Tokuzo Nakaoki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Radially adjustable internal grinder
    Patent number: 4507895
    Abstract: An internal grinder for grinding or polishing the inner surface and the like of a cylinder or ring gauge. A plurality of grind stones (256) are held by a grind stone holding member (251) in a manner to be movable in the radial directions of a spindle (203) and a projection value adjusting member (241) having engaged therewith the plurality of grind stones (256), respectively, is rotated relative to said grind stone holding member (251), whereby the plurality of grind stones (256) are adjusted in their projection values.
    Type: Grant
    Filed: November 15, 1982
    Date of Patent: April 2, 1985
    Assignee: Mitutoyo Mfg. Co. Ltd.
    Inventors: Hideo Sakata, Tokuzo Nakaoki
  • Height gauge
    Patent number: 4498241
    Abstract: A height gauge wherein a support or supports for movably supporting a slider are supported at the proximal ends thereof by a base, and a control wheel for operating a driving mechanism for driving the slider along the support or supports is provided on the base but not on the slider.
    Type: Grant
    Filed: August 4, 1982
    Date of Patent: February 12, 1985
    Assignee: Mitutoyo Mfg. Co., Ltd.
    Inventor: Tokuzo Nakaoki
  • Height gauge
    Patent number: 4458422
    Abstract: A height gauge is disclosed which rests on a surface plate and is used for measurement of dimensions and marking-off operations. Supports slidably supporting sliders are planted in rotary members rotatably provided on a base, and the measurement of dimensions and marking-off operations are performed in a state where the supports are held at inclinations by means of a locking device for preventing the rotary members from freely rotating.
    Type: Grant
    Filed: May 10, 1982
    Date of Patent: July 10, 1984
    Assignee: Mitutoyo Mfg. Co. Ltd.
    Inventors: Goro Nishikata, Tokuzo Nakaoki
  • Test indicator
    Patent number: 4142295
    Abstract: A test indicator comprising a holder to which is pivoted a measuring arm with a measuring tip; a casing equipped with a means for magnifying the displacement of said measuring tip; and an intermediate shaft which moves axially in response to pivoted displacement of the measuring tip, thereby transmitting pivotal displacement of the tip to the magnifying means, the holder being fitted to the casing for 360.degree. rotation around the intermediate shaft so that the plane of pivotal movement of the measuring tip can be changed.
    Type: Grant
    Filed: November 30, 1977
    Date of Patent: March 6, 1979
    Assignee: Kabushiki Kaisha Mitutoyo Seiskusho
    Inventors: Shingo Nishina, Tokuzo Nakaoki
  • Dial indicator
    Patent number: D254425
    Type: Grant
    Filed: February 1, 1978
    Date of Patent: March 11, 1980
    Assignee: Mitutoyo Mfg., Co., Ltd.
    Inventors: Shingo Nishina, Tokuzo Nakaoki
  • Micrometer
    Patent number: D274891
    Type: Grant
    Filed: February 17, 1982
    Date of Patent: July 31, 1984
    Assignee: Mitutoyo Mfg. Co., Ltd.
    Inventors: Takeshi Yamamoto, Hiroshi Yamashiro, Tokuzo Nakaoki