Abstract: Device for performing an interferometric measurement having a source for generating at least two coherent waves, an overlap apparatus for overlapping the at least two coherent waves and for generating an interference pattern, a measuring apparatus for measuring the interference pattern so as to form measured interference values, a disturbance apparatus for disturbing the interference pattern and an analyzer for analyzing the measured interference values, wherein the overlap apparatus comprises a passage region that is delimited at its edge by an edge element and is passed through by the at least two overlapping coherent waves, and comprises a beam-splitting element in the center region of the passage region.

Abstract: The invention relates to a method for detecting a measured value (d?/dx, M).

Abstract: The invention relates to a method for detecting a measured value (d?/dx, M).

Abstract: An embodiment of the invention relates to a method for carrying out a time-resolved interferometric measurement comprising the steps of generating at least two coherent waves, overlapping said at least two coherent waves and producing an interference pattern, measuring the interference pattern for a given exposure time, thereby forming measured interference values, and analyzing the measured interference values and extracting amplitude and/or phase information from the measured interference values. In at least one time segment, hereinafter referred to as disturbed time segment, of the expo-sure time, the interference pattern is intentionally disturbed or destroyed such that the corresponding measured interference values describe a disturbed or destroyed interference pattern.

Abstract: An embodiment of the invention relates to a method for carrying out a time-resolved interferometric measurement comprising the steps of generating at least two coherent waves, overlapping said at least two coherent waves and producing an interference pattern, measuring the interference pattern for a given exposure time, thereby forming measured interference values, and analyzing the measured interference values and extracting amplitude and/or phase information from the measured interference values. In at least one time segment, hereinafter referred to as disturbed time segment, of the exposure time, the interference pattern is intentionally disturbed or destroyed such that the corresponding measured interference values describe a disturbed or destroyed interference pattern.