Patents by Inventor Tom A. Walschap

Tom A. Walschap has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sensor circuit
    Patent number: 9255947
    Abstract: A method of measuring signals related to a photodiode based sensor and calculating a corrected data value thereof is disclosed. A nominal reset voltage value of the photodiode may be measured. A knee point voltage may be applied to the photodiode and resets a voltage on the photodiode to the knee point voltage when the voltage on the photodiode falls below the knee point voltage. Applying the knee point voltage may extend the dynamic range of the sensor. An output voltage of the photodiode at end of an integration time of the photodiode may be measured. The knee point voltage may be applied again after the end of the integration time. A voltage value of the photodiode of the knee point voltage may be measured. The nominal reset voltage value, the output voltage of a sensor and the knee point voltage may be reported to calculate the corrected data value.
    Type: Grant
    Filed: October 11, 2013
    Date of Patent: February 9, 2016
    Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
    Inventor: Tom A. Walschap
  • Pixel and method
    Patent number: 8987646
    Abstract: In accordance with an embodiment, a pixel includes a first stage coupled to a second stage. The second stage includes a sampling capacitor and a subtraction capacitor.
    Type: Grant
    Filed: June 10, 2011
    Date of Patent: March 24, 2015
    Assignee: Semiconductor Components Industries, LLC
    Inventors: Yannick De Witt, Tom A. Walschap, Tomas Geurts
  • SENSOR CIRCUIT
    Publication number: 20140043013
    Abstract: A method of measuring signals related to a photodiode based sensor and calculating a corrected data value thereof is disclosed. A nominal reset voltage value of the photodiode may be measured. A knee point voltage may be applied to the photodiode and resets a voltage on the photodiode to the knee point voltage when the voltage on the photodiode falls below the knee point voltage. Applying the knee point voltage may extend the dynamic range of the sensor. An output voltage of the photodiode at end of an integration time of the photodiode may be measured. The knee point voltage may be applied again after the end of the integration time. A voltage value of the photodiode of the knee point voltage may be measured. The nominal reset voltage value, the output voltage of a sensor and the knee point voltage may be reported to calculate the corrected data value.
    Type: Application
    Filed: October 11, 2013
    Publication date: February 13, 2014
    Applicant: Semiconductor Components Industries, LLC
    Inventor: Tom A. Walschap
  • Sensor circuit
    Patent number: 8558532
    Abstract: A method of measuring signals related to a photodiode based sensor and calculating a corrected data value thereof is disclosed. A nominal reset voltage value of the photodiode may be measured. A knee point voltage may be applied to the photodiode and resets a voltage on the photodiode to the knee point voltage when the voltage on the photodiode falls below the knee point voltage. Applying the knee point voltage may extend the dynamic range of the sensor. An output voltage of the photodiode at end of an integration time of the photodiode may be measured. The knee point voltage may be applied again after the end of the integration time. A voltage value of the photodiode of the knee point voltage may be measured. The nominal reset voltage value, the output voltage of a sensor and the knee point voltage may be reported to calculate the corrected data value.
    Type: Grant
    Filed: August 2, 2011
    Date of Patent: October 15, 2013
    Assignee: Semiconductor Components Industries, LLC
    Inventor: Tom A. Walschap
  • PIXEL AND METHOD
    Publication number: 20120312967
    Abstract: In accordance with an embodiment, a pixel includes a first stage coupled to a second stage. The second stage includes a sampling capacitor and a subtraction capacitor.
    Type: Application
    Filed: June 10, 2011
    Publication date: December 13, 2012
    Inventors: Yannick De Wit, Tom A. Walschap, Tomas Geurts
  • SENSOR CIRCUIT
    Publication number: 20110285403
    Abstract: A method of measuring signals related to a photodiode based sensor and calculating a corrected data value thereof is disclosed. A nominal reset voltage value of the photodiode may be measured. A knee point voltage may be applied to the photodiode and resets a voltage on the photodiode to the knee point voltage when the voltage on the photodiode falls below the knee point voltage. Applying the knee point voltage may extend the dynamic range of the sensor. An output voltage of the photodiode at end of an integration time of the photodiode may be measured. The knee point voltage may be applied again after the end of the integration time. A voltage value of the photodiode of the knee point voltage may be measured. The nominal reset voltage value, the output voltage of a sensor and the knee point voltage may be reported to calculate the corrected data value.
    Type: Application
    Filed: August 2, 2011
    Publication date: November 24, 2011
    Inventor: Tom A. Walschap
  • Minimizing the effect of directly converted x-rays in x-ray imagers
    Patent number: 7151287
    Abstract: In one embodiment, an image sensor for an x-ray imager includes a photodiode and a readout circuit. A deep well formed below the readout circuit may be configured as a diode to drain away parasitic electrons, which would otherwise induce noise in images. The parasitic electrons may be drained away to a power supply or a measuring circuit for dosimetrie purposes, for example.
    Type: Grant
    Filed: March 25, 2005
    Date of Patent: December 19, 2006
    Assignee: Cypress Semiconductor Corporation
    Inventors: Danny Scheffer, Tom A. Walschap