Patents by Inventor Tom C. L. Chen

Tom C. L. Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11294803
    Abstract: A test suite is executed to test a computer program for a plurality of variables. A variable value is generated for each variable of the plurality of variables at a predetermined location of the computer program. Whether a test included in the test suite is successful is determined. If the test is successful, the variable value is recorded as part of a success value set. If the test is not successful, the variable value is recorded as part of a failure value set. A confidence metric is calculated for the variable value. A relevance metric for each variable of the plurality of variables is measured, based on a Jaccard distance between the success value set and the failure value set. The failure value set, the success value set, the confidence metric for the variable value, and the relevance metric for each variable of the plurality of variables are presented.
    Type: Grant
    Filed: August 7, 2017
    Date of Patent: April 5, 2022
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Francisco M. Anaya, Tom C. L. Chen, Michael S. Fulton, Trong Truong
  • Patent number: 11294802
    Abstract: A test suite is executed to test a computer program for a plurality of variables. A variable value is generated for each variable of the plurality of variables at a predetermined location of the computer program. Whether a test included in the test suite is successful is determined. If the test is successful, the variable value is recorded as part of a success value set. If the test is not successful, the variable value is recorded as part of a failure value set. A confidence metric is calculated for the variable value. A relevance metric for each variable of the plurality of variables is measured, based on a Jaccard distance between the success value set and the failure value set. The failure value set, the success value set, the confidence metric for the variable value, and the relevance metric for each variable of the plurality of variables are presented.
    Type: Grant
    Filed: November 8, 2016
    Date of Patent: April 5, 2022
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Francisco M. Anaya, Tom C. L. Chen, Michael S. Fulton, Trong Truong
  • Publication number: 20180129597
    Abstract: A test suite is executed to test a computer program for a plurality of variables. A variable value is generated for each variable of the plurality of variables at a predetermined location of the computer program. Whether a test included in the test suite is successful is determined. If the test is successful, the variable value is recorded as part of a success value set. If the test is not successful, the variable value is recorded as part of a failure value set. A confidence metric is calculated for the variable value. A relevance metric for each variable of the plurality of variables is measured, based on a Jaccard distance between the success value set and the failure value set. The failure value set, the success value set, the confidence metric for the variable value, and the relevance metric for each variable of the plurality of variables are presented.
    Type: Application
    Filed: August 7, 2017
    Publication date: May 10, 2018
    Inventors: Francisco M. Anaya, Tom C.L. Chen, Michael S. Fulton, Trong Truong
  • Publication number: 20180129596
    Abstract: A test suite is executed to test a computer program for a plurality of variables. A variable value is generated for each variable of the plurality of variables at a predetermined location of the computer program. Whether a test included in the test suite is successful is determined. If the test is successful, the variable value is recorded as part of a success value set. If the test is not successful, the variable value is recorded as part of a failure value set. A confidence metric is calculated for the variable value. A relevance metric for each variable of the plurality of variables is measured, based on a Jaccard distance between the success value set and the failure value set. The failure value set, the success value set, the confidence metric for the variable value, and the relevance metric for each variable of the plurality of variables are presented.
    Type: Application
    Filed: November 8, 2016
    Publication date: May 10, 2018
    Inventors: Francisco M. Anaya, Tom C.L. Chen, Michael S. Fulton, Trong Truong
  • Patent number: 9436583
    Abstract: For debugging an application in a production environment, a breakpoint is set in the application. Responsive to the setting, recording is begun of information about a processing of a request in the application. Reaching the breakpoint is detected in the application during the processing of the request. A replica of the application is created including the breakpoint, the application becoming a primary application and the replica becoming a secondary application in a production environment. In the secondary application, a debugging operation is performed during a processing of a copy of the request after the breakpoint in the secondary application.
    Type: Grant
    Filed: November 6, 2015
    Date of Patent: September 6, 2016
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Tom C. L. Chen, Steven Cooper, Trong Truong
  • Patent number: 6525940
    Abstract: An integrated apparatus for thermal dissipation suitable for the thermal dissipation of the display chip and the memory chip on a display card. It comprises a baseboard, which contains the first side and the second side. The sets of first and second fins are located on the first side in which the first set is perpendicular to the first side and the second set forms an angle other than 90 degrees with the first side. The second side is in contact with both the display chip and the memory chip. A board hook is located on one side of baseboard that clamps on the edge of the display card. As well as, a fan is located on the first side between the sets of first and second fins.
    Type: Grant
    Filed: December 4, 2001
    Date of Patent: February 25, 2003
    Assignee: Leadtek Research Inc.
    Inventors: Daniel M. R. Chen, Tom C. L. Chen, Chi Ching Shou, Ming-Hui Lai