Patents by Inventor Tom D. Ohe

Tom D. Ohe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9817023
    Abstract: A sensor with continuous self test is provided. An exemplary inertial sensor may include one or more self test electrodes so that one or more test signals may be applied to the electrodes during normal operation of the sensor. Normal sensor output may be read and stored during normal operation, when self test signals are typically not applied to the sensor. The normal sensor output provides a baseline for comparison to a sensor offset error detection signal produced when a test signal may be applied to one self test electrode, and also to a sense error detection signal when a test signal may be applied to both self test electrodes.
    Type: Grant
    Filed: March 7, 2014
    Date of Patent: November 14, 2017
    Assignee: NXP USA, INC.
    Inventors: Todd F. Miller, Marco Fuhrmann, Tom D. Ohe
  • Publication number: 20140182351
    Abstract: A sensor with continuous self test is provided. An exemplary inertial sensor may include one or more self test electrodes so that one or more test signals may be applied to the electrodes during normal operation of the sensor. Normal sensor output may be read and stored during normal operation, when self test signals are typically not applied to the sensor. The normal sensor output provides a baseline for comparison to a sensor offset error detection signal produced when a test signal may be applied to one self test electrode, and also to a sense error detection signal when a test signal may be applied to both self test electrodes.
    Type: Application
    Filed: March 7, 2014
    Publication date: July 3, 2014
    Inventors: TODD F. MILLER, MARCO FUHRMANN, TOM D. OHE
  • Publication number: 20100122565
    Abstract: A sensor with continuous self test (101). An exemplary inertial sensor (106) may include one or more self test electrodes (208, 210) so that one or more test signals (402, 404) may be applied to the electrodes (208, 210) during normal operation of the sensor. Normal sensor output may be read and stored (316) during normal operation, when self test signals are typically not applied to the sensor. The normal sensor output provides a baseline for comparison to a sensor offset error detection signal (408) produced when a test signal may be applied to one self test electrode, and also to a sense error detection signal (406) produced when a test signal may be applied to both self test electrodes (208, 210).
    Type: Application
    Filed: November 15, 2008
    Publication date: May 20, 2010
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Todd F. Miller, Marco Fuhrmann, Tom D. Ohe
  • Publication number: 20090128160
    Abstract: A sensor system (20) includes transducers (32, 34) each yielding an analog signal (37, 39) representing a parameter independently sensed by each of the transducers (32, 34). The signals (37, 39) are summed and the resulting transducer signal (46) is converted to a digital transducer signal (26) by a high resolution analog-to-digital converter (ADC) (48). Concurrently, one of the signals (37, 39) is subtracted from the other. The resulting difference signal (56) is converted to a digital difference signal (60) by a low resolution ADC (58). When the digital difference signal (60) is within a threshold window (78), a fault signal (28) indicates a normal condition (80) of the transducers (32, 34). When the signal (60) falls outside of the threshold window (78), a fault signal (28) indicates a fault condition (82) of the transducers. The transducer and fault signals (26, 28) are concurrently output from the sensor system (20).
    Type: Application
    Filed: November 19, 2007
    Publication date: May 21, 2009
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Liviu Chiaburu, Marco Fuhrman, Tom D. Ohe