Abstract: A burn-in tester that provides independent control of the devices under test. The various operating parameters such as temperature, voltage, frequency of operation or test pattern being applied can be independently changed on one device without affecting the operating parameters of the other devices. Thus, e.g., the amount of cooling applied to one device is independent of the amount of cooling applied to another device. In addition, the testing being done on each device may be independently controlled. Thus, a test can be changed on one of the devices under test without affecting the tests being run on any of the other devices. Similarly, the voltage and frequency of operation can be controlled independently to allow for changes to the voltage and/or frequency of one device without affecting those parameters on other devices being tested.