Abstract: A method is provided for synchronizing the time scale of a test device driver (12) with an e-beam tester. Test device driver (12) generates a test pattern which is applied to the functional inputs (18) of a device under test (16). A trigger and a synchronizing signal are generated with an identical time relationship to the test pattern. The trigger is applied to the trigger input of e-beam tester electronics and e-beam generator (38). The synchronizing signal is caused to appear on device under test (16). Using e-beam tester electronics and e-beam generator (38), waveforms are created of the synchronizing signal appearing on device under test (16) and test response signals also appearing thereon in response to application of the test pattern to functional inputs (18). The time relationship between the synchronizing signal and the test response signals can then be established through the waveforms.