Abstract: A debug circuit for a multi-mode circuit driven by a clock signal, with an input for a clock signal, and a debug signal generator arranged to generate for each of a subset of the modes of the multi-mode circuit a corresponding debug signal based on a clock signal provided at the input. The frequency of debug signals is dependent on the frequency of a clock signal provided at the input, and each debug signal selects its respective mode for a length of time longer than that of each other mode of the multi-mode circuit, or each debug signal selects its respective mode for a length of time shorter than that of each other mode of the multi-mode circuit.

Abstract: There is provided a method for Loss of Signal Built In Self Test, and corresponding apparatus comprising: a loopback driver for receiving test signals, and for directing the test signals to at least one of a first output of the loopback driver and a second output of the loopback driver; a Digital to Analogue Converter DAC connected to the loopback driver for controlling the amplitude of the data input signals transmitted by the loopback driver; and coupling means for directing the scaled signals to a Loss of Signal detector.

Abstract: There is provided a power supply monitor circuit comprising a positive supply monitoring input, a negative supply monitoring input, and a voltage divider connected between the positive and negative supply monitoring inputs and having an intermediate node providing a potential intermediate those on the positive and negative supply monitoring inputs. A sampling circuit is connected to sample the potential at each of the positive supply input the negative supply input and the intermediate node. Also provided is a method of monitoring noise on a power supply whereby phase information from those samples is derived about the noise signals at the two said points.

Abstract: A debug circuit for a multi-mode circuit driven by a clock signal, with an input for a clock signal, and a debug signal generator arranged to generate for each of a subset of the modes of the multi-mode circuit a corresponding debug signal based on a clock signal provided at the input. The frequency of debug signals is dependent on the frequency of a clock signal provided at the input, and each debug signal selects its respective mode for a length of time longer than that of each other mode of the multi-mode circuit, or each debug signal selects its respective mode for a length of time shorter than that of each other mode of the multi-mode circuit.

Abstract: There is provided a method and apparatus for performing an eye scan. Said apparatus comprises: a receiver for receiving input signals; an equaliser for processing said input signals; a data sampler for sampling said processed input signals at certain sampling points to produce a data output, said data sampler being controlled by a clock signal; an edge sampler for detecting the edges of the processed input signal; an early/late voter for deciding whether a current sampling point needs to be advanced or retarded. The early/late voter passes an Up/Down signal to an interpolator for maintaining said clock signal, said interpolator acting on said Up/Down signal to adjust the clock signal by stepping it forward or backward according to control need, so that said sampling point can be advanced or retarded.

Abstract: There is provided a method and apparatus for performing an eye scan. Said apparatus comprises: a receiver for receiving input signals; an equaliser for processing said input signals; a data sampler for sampling said processed input signals at certain sampling points to produce a data output, said data sampler being controlled by a clock signal; an edge sampler for detecting the edges of the processed input signal; an early/late voter for deciding whether a current sampling point needs to be advanced or retarded. The early/late voter passes an Up/Down signal to an interpolator for maintaining said clock signal, said interpolator acting on said Up/Down signal to adjust the clock signal by stepping it forward or backward according to control need, so that said sampling point can be advanced or retarded.

Abstract: There is provided a power supply monitor circuit comprising a positive supply monitoring input, a negative supply monitoring input, and a voltage divider connected between the positive and negative supply monitoring inputs and having an intermediate node providing a potential intermediate those on the positive and negative supply monitoring inputs. A sampling circuit is connected to sample the potential at each of the positive supply input the negative supply input and the intermediate node. Also provided is a method of monitoring noise on a power supply whereby phase information from those samples is derived about the noise signals at the two said points.

Abstract: There is provided a test circuit comprising a test signal input for receiving a test signal, a hysteretic comparator having first and second comparison inputs and an output indicating the result of the comparison, and a delay circuit. The first comparison input is connected to the test signal input and the second comparison input is connected to receive the test signal on the test signal input via the delay circuit, the comparator thereby comparing the test signal on the test signal input with a delayed version of itself. Also provided is a test system comprising a first integrated circuit including the abovementioned test circuit, a second integrated circuit comprising test signal generation circuitry, and an interconnection between the generation circuitry and the test signal input of the test circuit of the first integrated circuit.

Abstract: There is provided a method for Loss of Signal Built In Self Test, and corresponding apparatus comprising: a loopback driver for receiving test signals, and for directing the test signals to at least one of a first output of the loopback driver and a second output of the loopback driver; a Digital to Analogue Converter DAC connected to the loopback driver for controlling the amplitude of the data input signals transmitted by the loopback driver; and coupling means for directing the scaled signals to a Loss of Signal detector.